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ShanghaiTech University Knowledge Management System
| X-ray optics development and metrology at Shanghai synchrotron radiation facility | |
| 2024-01 | |
| 会议录名称 | INTERNATIONAL CONFERENCE ON OPTICAL AND PHOTONIC ENGINEERING (ICOPEN 2023)
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| 发表状态 | 已发表 |
| DOI | 10.1117/12.3023334 |
| 摘要 | Modern third-generation synchrotron radiation sources provide more collimated, brighter, and coherent X-ray beams for experimental techniques. X-ray optics are the bridge between the light sources and the experimental stations. Any defect (either from mirrors or crystals) will bottleneck preventing the exploitation of the full characteristics of the source. In addition to high-quality X-ray optics, mirror mounting, and handling of thermal deformation are also of critical importance. Advanced metrology to properly exploit all the new potential of these optics is needed. Shanghai Synchrotron Radiation Facility (SSRF) has metrology labs equipped with visible-light-based measuring instruments and X-ray test beamline for in-situ metrology. In this article, we will present the current state of the art of mirrors, crystals, and diagnostics at SSRF. |
| 关键词 | X-ray optics Metrology Beamline Shanghai Synchrotron Radiation Facility |
| 收录类别 | EI |
| 语种 | 英语 |
| 文献类型 | 会议论文 |
| 条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/364627 |
| 专题 | 物质科学与技术学院_硕士生 物质科学与技术学院_博士生 |
| 通讯作者 | Xue, Lian; Luo, Hongxin |
| 作者单位 | 1.Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201800, China 2.ShanghaiTech University, Shanghai 201210, China 3.University of Chinese Academy of Sciences, Beijing 100049, China |
| 推荐引用方式 GB/T 7714 | Xue, Lian,Si, Shangyu,Zhang, Haipeng,et al. X-ray optics development and metrology at Shanghai synchrotron radiation facility[C],2024. |
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