ShanghaiTech University Knowledge Management System
Data acquisition of bunch IDs in timing system of SHINE beamlines and end stations | |
其他题名 | SHINE 束线站定时系统束团编号的数据采集 |
2023-06 | |
发表期刊 | HE JISHU/NUCLEAR TECHNIQUES |
ISSN | 0253-3219 |
卷号 | 46期号:6 |
发表状态 | 已发表 |
DOI | 10.11889/j.0253-3219.2023.hjs.46.060101 |
摘要 | [Background] Shanghai High repetition rate XFEL (X-ray free electron laser) and Extreme light facility (SHINE) is a high-repetition-rate X-ray-free electron laser. The timing system of the beamlines and endstations must provide high-precision bunch IDs and a timing trigger for the equipment that works in single-pulse mode. [Purpose] This study aims to design a data acquisition (DAQ) testing system to simultaneously acquire X-ray bunch IDs with their corresponding detector data package for subsequent data processing. [Methods] This DAQ testing system was developed on the Zynq UltraScale+ system-on-chip (SOC), and the White Rabbit protocol was employed for the timing system environment. A Bunch ID obtained from the FPGA mezzanine card (FMC) of the embedded White Rabbit node (WRN) was transferred to the server using a TCP protocol stack built on LwIP (light weight internet protocol). Finally, a Basler camera was employed to test this DAQ system, in which the pypylon library was applied to raw data acquisition software for camera snapshot whilst two channels of data were collected by an upper computer and saved to a database for comparison. [Results & Conclusions] The number of bunch IDs obtained by this acquisition test system is the same as that of image frames taken by Basler camera, which demonstrates that the testing system can satisfy the requirements of bunch ID acquisition in SHINE beamlines and endstations. © 2023 Science Press. All rights reserved. |
关键词 | Cameras Data handling Electrons Free electron lasers Programmable logic controllers Software testing System-on-chip Timing circuits X ray detectors Beam-lines Bunch ID End stations High repetition rate SHINE Testing systems Timing Timing systems White rabbit protocol X-ray free electron lasers |
收录类别 | EI |
语种 | 中文 |
出版者 | Science Press |
EI入藏号 | 20240615515857 |
EI主题词 | Data acquisition |
EI分类号 | 713.4 Pulse Circuits ; 714.2 Semiconductor Devices and Integrated Circuits ; 721.3 Computer Circuits ; 723.2 Data Processing and Image Processing ; 723.5 Computer Applications ; 732.1 Control Equipment ; 742.2 Photographic Equipment ; 744.5 Free Electron Lasers |
原始文献类型 | Journal article (JA) |
文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/359924 |
专题 | 大科学中心_公共科研平台_大科学装置建设部 物质科学与技术学院_硕士生 |
通讯作者 | Yin, Congcong |
作者单位 | 1.ShanghaiTech University, Shanghai; 200120, China; 2.Shanghai Aavanced Research Institute, Chinese Academy of Sciences, Shanghai; 201210, China |
第一作者单位 | 上海科技大学 |
通讯作者单位 | 上海科技大学 |
第一作者的第一单位 | 上海科技大学 |
推荐引用方式 GB/T 7714 | Yin, Liang,Zeng, Mengqi,Yin, Congcong,et al. Data acquisition of bunch IDs in timing system of SHINE beamlines and end stations[J]. HE JISHU/NUCLEAR TECHNIQUES,2023,46(6). |
APA | Yin, Liang,Zeng, Mengqi,Yin, Congcong,&Huai, Ping.(2023).Data acquisition of bunch IDs in timing system of SHINE beamlines and end stations.HE JISHU/NUCLEAR TECHNIQUES,46(6). |
MLA | Yin, Liang,et al."Data acquisition of bunch IDs in timing system of SHINE beamlines and end stations".HE JISHU/NUCLEAR TECHNIQUES 46.6(2023). |
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