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Modeling and Optimization of XOR Gate Based on Stochastic Thermodynamics | |
2024 | |
发表期刊 | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I: REGULAR PAPERS (IF:5.2[JCR-2023],4.5[5-Year]) |
ISSN | 1549-8328 |
EISSN | 1558-0806 |
卷号 | 71期号:1页码:348-358 |
发表状态 | 已发表 |
DOI | 10.1109/TCSI.2023.3331833 |
摘要 | To reduce the energy consumption of digital communication systems, chips based on the complementary metal-oxide-semiconductor (CMOS) technology are facing the challenge of low energy consumption for signal processing in communication systems. Some typical technologies, such as shortening the transistor size, reducing the number of electrons and lowering the supply voltage are widely used by present chips to achieve low energy consumption. However, as the gate size of transistors is getting closer to the mesoscopic scale, how to model and analyze the non-equilibrium information processing of transistors is an essential challenge for digital integrated circuits. In this paper, based on the stochastic thermodynamics theory, an energy consumption model of a single electron transistor XOR gate considering the input state transition is proposed. Moreover, the Landauer limit and mismatch theory are combined to derive the lower bound of the energy consumption of XOR gate for one operation. Simulation results show that the average energy consumption of XOR gate is the lowest when the supply voltage is five times the thermal noise voltage. Based on the proposed energy consumption model of XOR gate, an energy consumption model of parity check circuits is proposed. Then an optimization algorithm is designed to reduce the energy consumption of parity check circuits. Compared with the energy consumption of parity check circuits without optimization, simulation results show that the energy consumption of parity check circuits using the energy consumption optimization algorithm is maximumly reduced by 41.71%. © 2004-2012 IEEE. |
关键词 | Circuit simulation CMOS integrated circuits Computer circuits Digital communication systems Digital integrated circuits Energy utilization Field effect transistors Logic circuits Logic gates MOS devices Optimization Oxide semiconductors Signal encoding Single electron transistors Stochastic models Stochastic systems Thermodynamics Timing circuits Energy consumption model Energy consumption optimization Energy-consumption Integrated circuit modeling Parity check Parity check circuit Parity check codes Single-electron transistors Stochastic thermodynamics XOR gates |
URL | 查看原文 |
收录类别 | EI |
语种 | 英语 |
出版者 | Institute of Electrical and Electronics Engineers Inc. |
EI入藏号 | 20234915181894 |
EI主题词 | Random processes |
EI分类号 | 525.3 Energy Utilization ; 641.1 Thermodynamics ; 703.1.1 Electric Network Analysis ; 712.1 Semiconducting Materials ; 713.4 Pulse Circuits ; 714.2 Semiconductor Devices and Integrated Circuits ; 716.1 Information Theory and Signal Processing ; 721.2 Logic Elements ; 721.3 Computer Circuits ; 731.1 Control Systems ; 921.5 Optimization Techniques ; 922.1 Probability Theory ; 961 Systems Science |
原始文献类型 | Journal article (JA) |
来源库 | IEEE |
引用统计 | 正在获取...
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文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/359898 |
专题 | 信息科学与技术学院 信息科学与技术学院_PI研究组_哈亚军组 |
通讯作者 | Ge, Xiaohu |
作者单位 | 1.Huazhong University of Science and Technology, School of Electronic Information and Communications, Wuhan; 430074, China; 2.International Joint Research Center of Green Communications and Networking, Wuhan; 430074, China; 3.ShanghaiTech University, School of Information Science and Technology, Shanghai; 201210, China; 4.Shanghai Engineering Research Center of Energy Efficient and Custom Ai Ic, Shanghai; 201210, China |
推荐引用方式 GB/T 7714 | Peng, Xiaoxuan,Ge, Xiaohu,Ha, Yajun. Modeling and Optimization of XOR Gate Based on Stochastic Thermodynamics[J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I: REGULAR PAPERS,2024,71(1):348-358. |
APA | Peng, Xiaoxuan,Ge, Xiaohu,&Ha, Yajun.(2024).Modeling and Optimization of XOR Gate Based on Stochastic Thermodynamics.IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I: REGULAR PAPERS,71(1),348-358. |
MLA | Peng, Xiaoxuan,et al."Modeling and Optimization of XOR Gate Based on Stochastic Thermodynamics".IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I: REGULAR PAPERS 71.1(2024):348-358. |
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