High-resolution multi-mode electron and ion imaging spectrometer at SXFEL

doi:10.1088/1361-6501/ad25e1

	High-resolution multi-mode electron and ion imaging spectrometer at SXFEL
	Guo, Yuliang1,2 ; Hua, Xiaohong1,2,3 ; Jiang, Wenbin 2,3; Zhang, Mingjie 2,3; Wang, Xincheng1 ; Jiang, Yuhai1,2,3
	2024-05
发表期刊	MEASUREMENT SCIENCE AND TECHNOLOGY (IF:2.7[JCR-2023],2.4[5-Year])
ISSN	0957-0233
EISSN	1361-6501
卷号	35 期号:5
发表状态	已发表
DOI	10.1088/1361-6501/ad25e1
摘要	A new multi-mode electron and ion (MEI) imaging spectrometer with two arms of VMI and COLTRIMS/VMI (velocity map imaging/cold-target recoil-ion momentum spectroscopy) is designed to combine various photoelectron and ion detection modes for experiments at Shanghai soft x-ray free-electron laser (SXFEL) facility. The experiments can be optionally operated either with both ion and electron detection in a coincidence/covariance manner (VMI arm and COLTRIMS/VMI arm), or only photoelectron/photoion is detected with the high-resolution VMI arm. The simulated resolutions for 30-150 eV photoelectrons and 3.3 eV-18.0 eV N+ and N2+ photoions are up to 1.0% and 3.1%-1.0% according to our simulation, respectively. MEI spectrometer is expected to improve the experimental abilities significantly considering the low-repetition rate of the SXFEL and to enable the investigation of a diverse range of atomic and molecular phenomena triggered by soft x-ray free electron laser irradiation. © 2024 IOP Publishing Ltd.
关键词	Free electron lasers Ions Photons Spectrometers 4π electron/ion imaging Electron imaging Electron ions Imaging spectrometers Ion imaging Multi-mode electron and ion imaging spectrometer Multimodes Shanghai x-ray free-electron laser X-ray free electron lasers
收录类别	SCI ; EI
语种	英语
出版者	Institute of Physics
EI入藏号	20240815567087
EI主题词	Photoelectrons
EI分类号	711 Electromagnetic Waves ; 741.3 Optical Devices and Systems ; 744.5 Free Electron Lasers ; 931.3 Atomic and Molecular Physics
原始文献类型	Journal article (JA)
文献类型	期刊论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/349956
专题	物质科学与技术学院大科学中心_PI研究组_江玉海组物质科学与技术学院_硕士生物质科学与技术学院_博士生大科学中心_公共科研平台_大科学装置建设部
通讯作者	Wang, Xincheng; Jiang, Yuhai
作者单位	1.Center for Transformative Science, School of Physical Science and Technology, ShanghaiTech University, Shanghai; 201210, China; 2.Shanghai Advanced Research Institute, Chinese Academy of Sciences(CAS), Shanghai; 201210, China; 3.University of Chinese Academy of Sciences(UCAS), Beijing; 100049, China
第一作者单位	物质科学与技术学院
通讯作者单位	物质科学与技术学院
第一作者的第一单位	物质科学与技术学院
推荐引用方式 GB/T 7714	Guo, Yuliang,Hua, Xiaohong,Jiang, Wenbin,et al. High-resolution multi-mode electron and ion imaging spectrometer at SXFEL[J]. MEASUREMENT SCIENCE AND TECHNOLOGY,2024,35(5).
APA	Guo, Yuliang,Hua, Xiaohong,Jiang, Wenbin,Zhang, Mingjie,Wang, Xincheng,&Jiang, Yuhai.(2024).High-resolution multi-mode electron and ion imaging spectrometer at SXFEL.MEASUREMENT SCIENCE AND TECHNOLOGY,35(5).
MLA	Guo, Yuliang,et al."High-resolution multi-mode electron and ion imaging spectrometer at SXFEL".MEASUREMENT SCIENCE AND TECHNOLOGY 35.5(2024).