Design of a soft X-ray free-electron lasers arrival time diagnostic device
2023
会议录名称PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
ISSN0277-786X
卷号12765
发表状态已发表
DOI10.1117/12.2686629
摘要

Soft X-ray free-electron lasers (FELs) have gained significant attention as a research tool in X-ray ultrafast spectroscopy due to their ultra-high pulse brightness and ultra-short duration. Combined with an independent optical laser to perform pump-probe experiments with time resolution has wide-ranging application value and can have great impact on ultrafast dynamics research in fields such as energy catalysis, solid state physics, materials science, and biology. However, the inherent temporal and spatial jitter of soft X-ray FEL pulses significantly limits the time resolution in these experiments due to the low level of synchronization between the two independent light sources. Here, we present a spatiotemporal coupling device suitable for soft X-ray FELs. The device uses a self-designed four-blade slit device which is suitable for ultra-high vacuum environments to complete the spatial coupling between the two foci of both the soft X-ray FEL and optical laser, reducing the negative effects caused by spatial jitter of soft X-ray FEL beam spots. Based on this, a wavefront-splitting scheme is used to reflect and separate approximately 30% of the soft X-ray FEL beam for arrival time diagnosis. Based on the principle of transient decrease in the reflectivity of semiconductor material surfaces induced by X-rays, precise time measurement is achieved on a shot-by-shot basis through spectral encoding. After experiments, the data is rearranged according to the arrival time delay between the two pulses, effectively increasing the time resolution of the pump-probe experiment to the femtosecond scale. © 2023 SPIE.

会议录编者/会议主办者Chinese Optical Society (COS) ; The Society of Photo-Optical Instrumentation Engineers (SPIE)
关键词Electrons Encoding (symbols) Free electron lasers Jitter Optical pumping Probes Semiconductor lasers Signal encoding Arrival time Arrival time diagnostic Diagnostic device Four-blade slit Optical lasers Pump probe Pump-probe experiments Soft-X-ray free-electron-laser Spectral encoding Time-resolution
会议名称Optical Design and Testing XIII 2023
会议地点Beijing, China
会议日期October 14, 2023 - October 15, 2023
收录类别EI
语种英语
出版者SPIE
EI入藏号20240215367619
EI主题词Optical Laser
EISSN1996-756X
EI分类号716.1 Information Theory and Signal Processing ; 723.2 Data Processing and Image Processing ; 741.1 Light/Optics ; 744.4.1 Semiconductor Lasers ; 744.5 Free Electron Lasers
原始文献类型Conference article (CA)
文献类型会议论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/348717
专题物质科学与技术学院
物质科学与技术学院_硕士生
大科学中心_PI研究组_翁祖谦组
大科学中心_公共科研平台_大科学装置建设部
通讯作者Meng, Jianwei; Weng, Tsu-Chien
作者单位
School of Physical Science and Technology, ShanghaiTech University, Shanghai; 201210, China
第一作者单位物质科学与技术学院
通讯作者单位物质科学与技术学院
第一作者的第一单位物质科学与技术学院
推荐引用方式
GB/T 7714
Wei, Haoyu,Zhang, Kaiyu,Zhu, Ruixue,et al. Design of a soft X-ray free-electron lasers arrival time diagnostic device[C]//Chinese Optical Society (COS), The Society of Photo-Optical Instrumentation Engineers (SPIE):SPIE,2023.
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