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Design of a soft X-ray free-electron lasers arrival time diagnostic device | |
2023 | |
会议录名称 | PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING |
ISSN | 0277-786X |
卷号 | 12765 |
发表状态 | 已发表 |
DOI | 10.1117/12.2686629 |
摘要 | Soft X-ray free-electron lasers (FELs) have gained significant attention as a research tool in X-ray ultrafast spectroscopy due to their ultra-high pulse brightness and ultra-short duration. Combined with an independent optical laser to perform pump-probe experiments with time resolution has wide-ranging application value and can have great impact on ultrafast dynamics research in fields such as energy catalysis, solid state physics, materials science, and biology. However, the inherent temporal and spatial jitter of soft X-ray FEL pulses significantly limits the time resolution in these experiments due to the low level of synchronization between the two independent light sources. Here, we present a spatiotemporal coupling device suitable for soft X-ray FELs. The device uses a self-designed four-blade slit device which is suitable for ultra-high vacuum environments to complete the spatial coupling between the two foci of both the soft X-ray FEL and optical laser, reducing the negative effects caused by spatial jitter of soft X-ray FEL beam spots. Based on this, a wavefront-splitting scheme is used to reflect and separate approximately 30% of the soft X-ray FEL beam for arrival time diagnosis. Based on the principle of transient decrease in the reflectivity of semiconductor material surfaces induced by X-rays, precise time measurement is achieved on a shot-by-shot basis through spectral encoding. After experiments, the data is rearranged according to the arrival time delay between the two pulses, effectively increasing the time resolution of the pump-probe experiment to the femtosecond scale. © 2023 SPIE. |
会议录编者/会议主办者 | Chinese Optical Society (COS) ; The Society of Photo-Optical Instrumentation Engineers (SPIE) |
关键词 | Electrons Encoding (symbols) Free electron lasers Jitter Optical pumping Probes Semiconductor lasers Signal encoding Arrival time Arrival time diagnostic Diagnostic device Four-blade slit Optical lasers Pump probe Pump-probe experiments Soft-X-ray free-electron-laser Spectral encoding Time-resolution |
会议名称 | Optical Design and Testing XIII 2023 |
会议地点 | Beijing, China |
会议日期 | October 14, 2023 - October 15, 2023 |
收录类别 | EI |
语种 | 英语 |
出版者 | SPIE |
EI入藏号 | 20240215367619 |
EI主题词 | Optical Laser |
EISSN | 1996-756X |
EI分类号 | 716.1 Information Theory and Signal Processing ; 723.2 Data Processing and Image Processing ; 741.1 Light/Optics ; 744.4.1 Semiconductor Lasers ; 744.5 Free Electron Lasers |
原始文献类型 | Conference article (CA) |
文献类型 | 会议论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/348717 |
专题 | 物质科学与技术学院 物质科学与技术学院_硕士生 大科学中心_PI研究组_翁祖谦组 大科学中心_公共科研平台_大科学装置建设部 |
通讯作者 | Meng, Jianwei; Weng, Tsu-Chien |
作者单位 | School of Physical Science and Technology, ShanghaiTech University, Shanghai; 201210, China |
第一作者单位 | 物质科学与技术学院 |
通讯作者单位 | 物质科学与技术学院 |
第一作者的第一单位 | 物质科学与技术学院 |
推荐引用方式 GB/T 7714 | Wei, Haoyu,Zhang, Kaiyu,Zhu, Ruixue,et al. Design of a soft X-ray free-electron lasers arrival time diagnostic device[C]//Chinese Optical Society (COS), The Society of Photo-Optical Instrumentation Engineers (SPIE):SPIE,2023. |
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