Direct In- and Out-of-Plane Writing of Metals on Insulators by Electron-Beam-Enabled, Confined Electrodeposition with Submicrometer Feature Size
2024
发表期刊SMALL METHODS (IF:10.7[JCR-2023],12.1[5-Year])
ISSN2366-9608
EISSN2366-9608
卷号8期号:7
发表状态已发表
DOI10.1002/smtd.202301247
摘要

Additive microfabrication processes based on localized electroplating enable the one-step deposition of micro-scale metal structures with outstanding performance, e.g., high electrical conductivity and mechanical strength. They are therefore evaluated as an exciting and enabling addition to the existing repertoire of microfabrication technologies. Yet, electrochemical processes are generally restricted to conductive or semiconductive substrates, precluding their application in the manufacturing of functional electric devices where direct deposition onto insulators is often required. Here, the direct, localized electrodeposition of copper on a variety of insulating substrates, namely Al2O3, glass and flexible polyethylene, is demonstrated, enabled by electron-beam-induced reduction in a highly confined liquid electrolyte reservoir. The nanometer-size of the electrolyte reservoir, fed by electrohydrodynamic ejection, enables a minimal feature size on the order of 200 nm. The fact that the transient reservoir is established and stabilized by electrohydrodynamic ejection rather than specialized liquid cells can offer greater flexibility toward deposition on arbitrary substrate geometries and materials. Installed in a low-vacuum scanning electron microscope, the setup further allows for operando, nanoscale observation and analysis of the manufacturing process. © 2024 The Authors. Small Methods published by Wiley-VCH GmbH.

关键词3D printing Additives Alumina Aluminum oxide Electrodeposition Electrodes Electrolytes Electron beams Electrons Metal substrates Microanalysis Microfabrication Nanotechnology Scanning electron microscopy 3D nanofabrication Electrolyte reservoirs Electron-beam Feature sizes Localised Microfabrication process Microscale Nano scale Out-of-plane Submicrometers
收录类别EI
语种英语
出版者John Wiley and Sons Inc
EI入藏号20240115328840
EI主题词Electrohydrodynamics
EI分类号539.3.1 Electroplating ; 702 Electric Batteries and Fuel Cells ; 745.1.1 Printing Equipment ; 761 Nanotechnology ; 803 Chemical Agents and Basic Industrial Chemicals ; 804 Chemical Products Generally ; 804.2 Inorganic Compounds ; 813.2 Coating Materials
原始文献类型Article in Press
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文献类型期刊论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/348630
专题物质科学与技术学院
物质科学与技术学院_PI研究组_王竹君组
通讯作者Spolenak, Ralph
作者单位
1.Laboratory for Nanometallurgy, Department of Materials, ETH Zürich, Vladimir-Prelog-Weg 1-5/10, Zürich; 8093, Switzerland
2.Scientific Center of Optical and Electron Microscopy, ScopeM, ETH Zürich, Otto-Stern Weg 3, Zürich; 8093, Switzerland
3.School of Physical Science and Technology, ShanghaiTech University, 393 Middle Huaxia Road, Shanghai; 201210, China
4.School of Natural Science, Department of Chemistry, Technical University of Munich, Lichtenbergstraße 4, Garching; 85747, Germany
5.Department of Materials Science and Engineering, KTH Royal Institute of Technology, Brinellvägen 23, Stockholm; 11428, Sweden
推荐引用方式
GB/T 7714
Nydegger, Mirco,Wang, Zhu-Jun,Willinger, Marc Georg,et al. Direct In- and Out-of-Plane Writing of Metals on Insulators by Electron-Beam-Enabled, Confined Electrodeposition with Submicrometer Feature Size[J]. SMALL METHODS,2024,8(7).
APA Nydegger, Mirco,Wang, Zhu-Jun,Willinger, Marc Georg,Spolenak, Ralph,&Reiser, Alain.(2024).Direct In- and Out-of-Plane Writing of Metals on Insulators by Electron-Beam-Enabled, Confined Electrodeposition with Submicrometer Feature Size.SMALL METHODS,8(7).
MLA Nydegger, Mirco,et al."Direct In- and Out-of-Plane Writing of Metals on Insulators by Electron-Beam-Enabled, Confined Electrodeposition with Submicrometer Feature Size".SMALL METHODS 8.7(2024).
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