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Direct In- and Out-of-Plane Writing of Metals on Insulators by Electron-Beam-Enabled, Confined Electrodeposition with Submicrometer Feature Size | |
2024 | |
发表期刊 | SMALL METHODS (IF:10.7[JCR-2023],12.1[5-Year]) |
ISSN | 2366-9608 |
EISSN | 2366-9608 |
卷号 | 8期号:7 |
发表状态 | 已发表 |
DOI | 10.1002/smtd.202301247 |
摘要 | Additive microfabrication processes based on localized electroplating enable the one-step deposition of micro-scale metal structures with outstanding performance, e.g., high electrical conductivity and mechanical strength. They are therefore evaluated as an exciting and enabling addition to the existing repertoire of microfabrication technologies. Yet, electrochemical processes are generally restricted to conductive or semiconductive substrates, precluding their application in the manufacturing of functional electric devices where direct deposition onto insulators is often required. Here, the direct, localized electrodeposition of copper on a variety of insulating substrates, namely Al2O3, glass and flexible polyethylene, is demonstrated, enabled by electron-beam-induced reduction in a highly confined liquid electrolyte reservoir. The nanometer-size of the electrolyte reservoir, fed by electrohydrodynamic ejection, enables a minimal feature size on the order of 200 nm. The fact that the transient reservoir is established and stabilized by electrohydrodynamic ejection rather than specialized liquid cells can offer greater flexibility toward deposition on arbitrary substrate geometries and materials. Installed in a low-vacuum scanning electron microscope, the setup further allows for operando, nanoscale observation and analysis of the manufacturing process. © 2024 The Authors. Small Methods published by Wiley-VCH GmbH. |
关键词 | 3D printing Additives Alumina Aluminum oxide Electrodeposition Electrodes Electrolytes Electron beams Electrons Metal substrates Microanalysis Microfabrication Nanotechnology Scanning electron microscopy 3D nanofabrication Electrolyte reservoirs Electron-beam Feature sizes Localised Microfabrication process Microscale Nano scale Out-of-plane Submicrometers |
收录类别 | EI |
语种 | 英语 |
出版者 | John Wiley and Sons Inc |
EI入藏号 | 20240115328840 |
EI主题词 | Electrohydrodynamics |
EI分类号 | 539.3.1 Electroplating ; 702 Electric Batteries and Fuel Cells ; 745.1.1 Printing Equipment ; 761 Nanotechnology ; 803 Chemical Agents and Basic Industrial Chemicals ; 804 Chemical Products Generally ; 804.2 Inorganic Compounds ; 813.2 Coating Materials |
原始文献类型 | Article in Press |
引用统计 | 正在获取...
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文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/348630 |
专题 | 物质科学与技术学院 物质科学与技术学院_PI研究组_王竹君组 |
通讯作者 | Spolenak, Ralph |
作者单位 | 1.Laboratory for Nanometallurgy, Department of Materials, ETH Zürich, Vladimir-Prelog-Weg 1-5/10, Zürich; 8093, Switzerland 2.Scientific Center of Optical and Electron Microscopy, ScopeM, ETH Zürich, Otto-Stern Weg 3, Zürich; 8093, Switzerland 3.School of Physical Science and Technology, ShanghaiTech University, 393 Middle Huaxia Road, Shanghai; 201210, China 4.School of Natural Science, Department of Chemistry, Technical University of Munich, Lichtenbergstraße 4, Garching; 85747, Germany 5.Department of Materials Science and Engineering, KTH Royal Institute of Technology, Brinellvägen 23, Stockholm; 11428, Sweden |
推荐引用方式 GB/T 7714 | Nydegger, Mirco,Wang, Zhu-Jun,Willinger, Marc Georg,et al. Direct In- and Out-of-Plane Writing of Metals on Insulators by Electron-Beam-Enabled, Confined Electrodeposition with Submicrometer Feature Size[J]. SMALL METHODS,2024,8(7). |
APA | Nydegger, Mirco,Wang, Zhu-Jun,Willinger, Marc Georg,Spolenak, Ralph,&Reiser, Alain.(2024).Direct In- and Out-of-Plane Writing of Metals on Insulators by Electron-Beam-Enabled, Confined Electrodeposition with Submicrometer Feature Size.SMALL METHODS,8(7). |
MLA | Nydegger, Mirco,et al."Direct In- and Out-of-Plane Writing of Metals on Insulators by Electron-Beam-Enabled, Confined Electrodeposition with Submicrometer Feature Size".SMALL METHODS 8.7(2024). |
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