High-precision Measurement System using Multi-laser and Multi-DOF of the Complex Surface 3 Profile

doi:10.1109/OGC59456.2023.10314633

	High-precision Measurement System using Multi-laser and Multi-DOF of the Complex Surface 3 Profile
	Deng, Chunyu1 ; Xie, Guangping2 ; Wu, Yingna2 ; Ni, Na2
	2023-09-08
会议录名称	2023 IEEE 8TH OPTOELECTRONICS GLOBAL CONFERENCE (OGC)
页码	99-101
发表状态	已发表
DOI	10.1109/OGC59456.2023.10314633
摘要	For the measurement of complex surfaces, this paper implements a high-precision measurement system. In this system, three high-precision line laser sensors are used, which have three degrees of freedom in motion. A self-developed external calibration algorithm is used to achieve high-precision measurement of complex surfaces. Experimental results show that the precision of this method on standard gauges is less than 5um, and the actual blade measurement precision is less than 15um. © 2023 IEEE.
会议录编者/会议主办者	IEEE Photonics Society Guangdong Chapter
关键词	Optical sensing surface detection calibration algorithm
会议名称	8th Optoelectronics Global Conference, OGC 2023
会议地点	Shenzhen, China
会议日期	5-8 Sept. 2023
URL	查看原文
收录类别	EI
语种	英语
出版者	Institute of Electrical and Electronics Engineers Inc.
EI入藏号	20235015217410
EI主题词	Degrees of freedom (mechanics)
EI分类号	931.1 Mechanics
原始文献类型	Conference article (CA)
来源库	IEEE
文献类型	会议论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/347932
专题	创意与艺术学院_PI研究组(P)_谢广平组物质科学与技术学院_硕士生创意与艺术学院_PI研究组(P)_武颖娜组
通讯作者	Ni, Na
作者单位	1.ShanghaiTech University, School of Physic Science and Technology, Shanghai, China; 2.ShanghaiTech University, Center for Adaptive System Engineering, Shanghai, China
第一作者单位	上海科技大学
通讯作者单位	上海科技大学
第一作者的第一单位	上海科技大学
推荐引用方式 GB/T 7714	Deng, Chunyu,Xie, Guangping,Wu, Yingna,et al. High-precision Measurement System using Multi-laser and Multi-DOF of the Complex Surface 3 Profile[C]//IEEE Photonics Society Guangdong Chapter:Institute of Electrical and Electronics Engineers Inc.,2023:99-101.