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| An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures | |
| 2019-04-10 | |
| Source Publication | MATERIALS
 |
| ISSN | 1996-1944 |
| Volume | 12Issue:7 |
| Status | 已发表 |
| DOI | 10.3390/ma12071141 |
| Abstract | Thermal control materials are employed to adjust the temperature of a spacecraft operating in deep space. The spectral emissivity is a crucial factor in evaluating the thermal radiative properties of such materials. An apparatus, composed of a Fourier transform infrared spectrometer (FTIR), a sample cooling chamber and a mechanical modulation system was demonstrated to measure low temperature infrared spectral emissivity under vacuum. The mechanical modulation system, which includes a chopper and a lock-in amplifier, is employed to reduce the interference of background radiation during measurements. The limitation of the Fourier transform frequency on the chopper frequency can be eliminated by setting the FTIR on step-scan mode. The apparatus is separated into two parts and evacuated by different pumps. In this study, a high quality emission spectrum of a sample is measured by the apparatus. The spectral emissivity of thermal control materials are obtained in the wavelength range of 8 to 14 m at 173 and 213 K. The combined standard uncertainty of the apparatus is 3.30% at 213 K. |
| Keyword | spectral emissivity radiation vacuum low temperature |
| Indexed By | SCI ; SCIE ; EI |
| Language | 英语 |
| WOS Research Area | Materials Science |
| WOS Subject | Materials Science, Multidisciplinary |
| WOS ID | WOS:000465500700140 |
| Publisher | MDPI |
| EI Accession Number | 20192006939298 |
| EI Keywords | Electromagnetic wave emission ; Emission spectroscopy ; Fourier series ; Heat radiation ; Modulation ; Temperature ; Thermal variables control ; Vacuum |
| EI Classification Number | Vacuum Technology:633 ; Thermodynamics:641.1 ; Heat Transfer:641.2 ; Electromagnetic Waves:711 ; Specific Variables Control:731.3 ; Chemistry:801 ; Mathematical Transformations:921.3 |
| WOS Keyword | VACUUM ; AMPLIFIER ; CAVITY ; STEEL ; RANGE |
| Original Document Type | Article |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/34337 |
| Collection | 物质科学与技术学院_硕士生 |
| Corresponding Author | Zhang, Yuzhi |
| Affiliation | 1.Chinese Acad Sci, Shanghai Inst Ceram, Key Lab Inorgan Coating Mat CAS, Shanghai 200050, Peoples R China 2.Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing 100049, Peoples R China 3.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China |
| First Author Affilication | School of Physical Science and Technology |
| Recommended Citation GB/T 7714 | Ma, Jiayu,Zhang, Yuzhi,Wu, Lingnan,et al. An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures[J]. MATERIALS,2019,12(7). |
| APA | Ma, Jiayu,Zhang, Yuzhi,Wu, Lingnan,Li, Haogeng,&Song, Lixin.(2019).An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures.MATERIALS,12(7). |
| MLA | Ma, Jiayu,et al."An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures".MATERIALS 12.7(2019). |
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