ShanghaiTech University Knowledge Management System
| Deep learning assisted far-field multi-beam pointing measurement | |
| 2023-08-01 | |
| Source Publication | OPTICAL ENGINEERING
 |
| ISSN | 0091-3286 |
| EISSN | 1560-2303 |
| Volume | 62Issue:8 |
| Status | 已发表 |
| DOI | 10.1117/1.OE.62.8.086102 |
| Abstract | We present and experimentally verify a deep learning approach to synchronously measure the multi-beam pointing error for coherent beam combining systems. This approach uses only one detector by acquiring the far-field interference focal spot, which can greatly reduce the complexity in coherent beam combining systems with high accuracy. The amplitude modulation is utilized to eliminate the confusion of the label values in symmetric system. The position assist camera is used to acquire accurate label value, which solves the mismatch between sample and label value caused by ambient vibration in long-term data acquisition. In simulation and experiment, the RMS accuracy is about 0.3 and 0.5 μrad, respectively, which can greatly meet the pointing measurement requirement in coherent beam combining systems. The result shows that this approach can be well applied to multi-beam coherent combination for high-power laser systems. © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 International License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI. |
| Keyword | Deep learning High power lasers Beam pointing Beam pointing errors Coherent beam combinations Coherent beam combining Combining systems Deep learning Far-field Learning approach Multi-beam pointing Multibeams |
| URL | 查看原文 |
| Indexed By | EI ; SCI |
| Language | 英语 |
| Funding Project | Shanghai Science and Technology Innovation Action Plan Project[19142202500] ; National Natural Science Foundation of China (NSFC)[11974367] ; Program of Shanghai Academic/Technology Research Leader[20SR014501] |
| WOS Research Area | Optics |
| WOS Subject | Optics |
| WOS ID | WOS:001082650700002 |
| Publisher | SPIE |
| EI Accession Number | 20233814773336 |
| EI Keywords | Data acquisition |
| EI Classification Number | 461.4 Ergonomics and Human Factors Engineering ; 723.2 Data Processing and Image Processing ; 744.1 Lasers, General |
| Original Document Type | Journal article (JA) |
| Document Type | 期刊论文 |
| Identifier | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/335585 |
| Collection | 物质科学与技术学院 物质科学与技术学院_特聘教授组_梁晓燕组 物质科学与技术学院_博士生 |
| Corresponding Author | Peng, Chun |
| Affiliation | 1.Univ Chinese Acad Sci, Ctr Mat Sci & Optoelect Engn, Beijing, Peoples R China 2.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai, Peoples R China 3.Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, State Key Lab High Field Laser Phys, Shanghai, Peoples R China 4.Zhangjiang Lab, Shanghai, Peoples R China |
| First Author Affilication | School of Physical Science and Technology |
| Recommended Citation GB/T 7714 | Li, Xunzheng,Peng, Chun,Liang, Xiaoyan. Deep learning assisted far-field multi-beam pointing measurement[J]. OPTICAL ENGINEERING,2023,62(8). |
| APA | Li, Xunzheng,Peng, Chun,&Liang, Xiaoyan.(2023).Deep learning assisted far-field multi-beam pointing measurement.OPTICAL ENGINEERING,62(8). |
| MLA | Li, Xunzheng,et al."Deep learning assisted far-field multi-beam pointing measurement".OPTICAL ENGINEERING 62.8(2023). |
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