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Hercules: Enabling Atomic Durability for Persistent Memory with Transient Persistence Domain | |
2023 | |
发表期刊 | ACM TRANSACTIONS ON EMBEDDED COMPUTING SYSTEMS (TECS)
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ISSN | 1539-9087 |
EISSN | 1558-3465 |
卷号 | 23期号:6 |
发表状态 | 已发表 |
DOI | 10.1145/3607473 |
摘要 | Persistent memory (pmem) products bring the persistence domain up to the memory level. Intel recently introduced the eADR feature that guarantees to flush data buffered in CPU cache to pmem on a power outage, thereby making the CPU cache a transient persistence domain. . Researchers have explored how to enable the atomic durability for applications' in-pmem data. In this article, we exploit the eADR-supported CPU cache to do so. A modified cache line, until written back to pmem, is a natural redo log copy of the in-pmem data. However, a write-back due to cache replacement or eADR on a crash overwrites the original copy. We accordingly developed Hercules, a hardware logging design for the transaction-level atomic durability, with supportive components installed in CPU cache, memory controller (MC), and pmem. When a transaction commits, Hercules commits on-chip its data staying in cache lines. For cache lines evicted before the commit, Hercules asks the MC to redirect and persist them into in-pmem log entries and commits them off-chip upon committing the transaction. Hercules lazily conducts pmem writes only for cache replacements at runtime. On a crash, Hercules saves metadata and data for active transactions into pmem for recovery. Experiments show that, by using CPU cache for both buffering and logging, Hercules yields much higher throughput and incurs significantly fewer pmem writes than state-of-the-art designs. |
关键词 | Atomic durability persistent memory transient persistence domain |
URL | 查看原文 |
收录类别 | SCIE ; SCI ; EI |
语种 | 英语 |
WOS研究方向 | Computer Science |
WOS类目 | Computer Science, Hardware & Architecture ; Computer Science, Software Engineering |
WOS记录号 | WOS:001325890900003 |
出版者 | ASSOC COMPUTING MACHINERY |
EI入藏号 | 20244017150612 |
EI主题词 | Cache memory |
EI分类号 | 1103.1 ; 1106.1 ; 701 Electricity and Magnetism |
原始文献类型 | Journal article (JA) |
文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/331091 |
专题 | 信息科学与技术学院_硕士生 信息科学与技术学院_PI研究组_王春东组 |
通讯作者 | WANG, CHUNDONG |
作者单位 | 1.School of Information Science and Technology, ShanghaiTech University, China 2.Shanghai Engineering Research Center of Energy Efficient and Custom AI IC, China |
第一作者单位 | 信息科学与技术学院 |
通讯作者单位 | 信息科学与技术学院 |
第一作者的第一单位 | 信息科学与技术学院 |
推荐引用方式 GB/T 7714 | YE, CHONGNAN,CHEN, MENG,JIANG, QISHENG,et al. Hercules: Enabling Atomic Durability for Persistent Memory with Transient Persistence Domain[J]. ACM TRANSACTIONS ON EMBEDDED COMPUTING SYSTEMS (TECS),2023,23(6). |
APA | YE, CHONGNAN,CHEN, MENG,JIANG, QISHENG,&WANG, CHUNDONG.(2023).Hercules: Enabling Atomic Durability for Persistent Memory with Transient Persistence Domain.ACM TRANSACTIONS ON EMBEDDED COMPUTING SYSTEMS (TECS),23(6). |
MLA | YE, CHONGNAN,et al."Hercules: Enabling Atomic Durability for Persistent Memory with Transient Persistence Domain".ACM TRANSACTIONS ON EMBEDDED COMPUTING SYSTEMS (TECS) 23.6(2023). |
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