ShanghaiTech University Knowledge Management System
Group Testing With Side Information via Generalized Approximate Message Passing | |
2023 | |
会议录名称 | IEEE TRANSACTIONS ON SIGNAL PROCESSING (IF:4.6[JCR-2023],5.2[5-Year]) |
ISSN | 1053-587X |
卷号 | 71 |
页码 | 2366-2375 |
DOI | 10.1109/TSP.2023.3287671 |
摘要 | Group testing can help maintain a widespread testing program using fewer resources amid a pandemic. In a group testing setup, we are given n samples, one per individual. Each individual is either infected or uninfected. These samples are arranged into m © 1991-2012 IEEE. |
关键词 | Message passing Signal processing Software testing Compressed-Sensing Contact tracing Decoding Generalized approximate message passing Message-passing Noise measurements Non-adaptive group testing Pandemic Signal processing algorithms |
URL | 查看原文 |
收录类别 | EI |
语种 | 英语 |
出版者 | Institute of Electrical and Electronics Engineers Inc. |
EI入藏号 | 20232714334860 |
EI主题词 | Approximation algorithms |
EISSN | 1941-0476 |
EI分类号 | 716.1 Information Theory and Signal Processing ; 723.1 Computer Programming ; 723.2 Data Processing and Image Processing ; 723.5 Computer Applications ; 921 Mathematics |
原始文献类型 | Conference article (CA) |
引用统计 | 正在获取...
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文献类型 | 会议论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/317218 |
专题 | 信息科学与技术学院_本科生 |
通讯作者 | Cao, Shu-Jie |
作者单位 | 1.ShanghaiTech University, Shanghai; 201210, China; 2.Northwestern University, Department of Electrical and Computer Engineering, Evanston; IL; 60208, United States; 3.IIT Bombay, Mumbai; 400076, India; 4.The University of British Columbia, Department of Mathematics, Vancouver; BC; V6T 1Z4, Canada; 5.NC State University, Department of Electrical and Computer Engineering, Raleigh; NC; 27695, United States; 6.IIT Bombay, Department of Computer Science and Engineering, Mumbai; 400076, India |
第一作者单位 | 上海科技大学 |
通讯作者单位 | 上海科技大学 |
第一作者的第一单位 | 上海科技大学 |
推荐引用方式 GB/T 7714 | Cao, Shu-Jie,Goenka, Ritesh,Wong, Chau-Wai,et al. Group Testing With Side Information via Generalized Approximate Message Passing[C]:Institute of Electrical and Electronics Engineers Inc.,2023:2366-2375. |
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