Single-pulse characterization of the focal spot size of X-ray free-electron lasers using coherent diffraction imaging

doi:10.1107/S1600577523000887

	Single-pulse characterization of the focal spot size of X-ray free-electron lasers using coherent diffraction imaging
	Gao, Zichen1 ; Fan, Jiadong2 ; Tong, Yajun2 ; Zhang, Jianhua2 ; He, Bo1 ; Nie, Yonggan2 ; Luan, Hui2 ; Lu, Donghao1 ; Zhang, Difei1 ; Yuan, Xinye1 ; Wang, Yueran1 ; Liu, Zhi 1,2; Jiang, Huaidong1,2
	2023-05-01
发表期刊	JOURNAL OF SYNCHROTRON RADIATION (IF:2.4[JCR-2023],2.5[5-Year])
ISSN	0909-0495
EISSN	1600-5775
卷号	30 期号:Pt 3 页码:505-513
发表状态	已发表
DOI	10.1107/S1600577523000887
摘要	The characterization of X-ray focal spots is of great significance for the diagnosis and performance optimization of focusing systems. X-ray free-electron lasers (XFELs) are the latest generation of X-ray sources with ultrahigh brilliance, ultrashort pulse duration and nearly full transverse coherence. Because each XFEL pulse is unique and has an ultrahigh peak intensity, it is difficult to characterize its focal spot size individually with full power. Herein, a method for characterizing the spot size at the focus position is proposed based on coherent diffraction imaging. A numerical simulation was conducted to verify the feasibility of the proposed method. The focal spot size of the Coherent Scattering and Imaging endstation at the Shanghai Soft X-ray Free Electron Laser Facility was characterized using the method. The full width at half-maxima of the focal spot intensity and spot size in the horizontal and vertical directions were calculated to be 2.10 +/- 0.24 mu m and 2.00 +/- 0.20 mu m, respectively. An ablation imprint on the silicon frame was used to validate the results of the proposed method.
关键词	X-ray free-electron laser coherent diffraction imaging spot size characterization KB focusing
URL	查看原文
收录类别	SCI ; EI
语种	英语
资助项目	Strategic Priority Research Program of the Chinese Academy of Sciences[XDB 37040303] ; National Natural Science Foundation of China[21727817] ; Major State Basic Research Development Program of China[2017YFA0504802]
WOS研究方向	Instruments & Instrumentation ; Optics ; Physics
WOS类目	Instruments & Instrumentation ; Optics ; Physics, Applied
WOS记录号	WOS:000980808100002
出版者	INT UNION CRYSTALLOGRAPHY
EI入藏号	20232014101171
EI主题词	Coherent scattering
EI分类号	711 Electromagnetic Waves ; 744.5 Free Electron Lasers ; 921.6 Numerical Methods
原始文献类型	Journal article (JA)
引用统计	正在获取...
文献类型	期刊论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/305018
专题	物质科学与技术学院大科学中心_PI研究组_江怀东组物质科学与技术学院_硕士生物质科学与技术学院_博士生大科学中心_公共科研平台_大科学装置建设部
通讯作者	Fan, Jiadong; Jiang, Huaidong
作者单位	1.ShanghaiTech Univ, Sch Phys Sci & Technol, 393 Middle Huaxia Rd, Shanghai 201210, Peoples R China 2.ShanghaiTech Univ, Ctr Transformat Sci, 393 Middle Huaxia Rd, Shanghai 201210, Peoples R China
第一作者单位	物质科学与技术学院
通讯作者单位	上海科技大学; 物质科学与技术学院
第一作者的第一单位	物质科学与技术学院
推荐引用方式 GB/T 7714	Gao, Zichen,Fan, Jiadong,Tong, Yajun,et al. Single-pulse characterization of the focal spot size of X-ray free-electron lasers using coherent diffraction imaging[J]. JOURNAL OF SYNCHROTRON RADIATION,2023,30(Pt 3):505-513.
APA	Gao, Zichen.,Fan, Jiadong.,Tong, Yajun.,Zhang, Jianhua.,He, Bo.,...&Jiang, Huaidong.(2023).Single-pulse characterization of the focal spot size of X-ray free-electron lasers using coherent diffraction imaging.JOURNAL OF SYNCHROTRON RADIATION,30(Pt 3),505-513.
MLA	Gao, Zichen,et al."Single-pulse characterization of the focal spot size of X-ray free-electron lasers using coherent diffraction imaging".JOURNAL OF SYNCHROTRON RADIATION 30.Pt 3(2023):505-513.