ShanghaiTech University Knowledge Management System
Grating Interferometry with High Optical Subdivision | |
2018 | |
会议录名称 | HOLOGRAPHY, DIFFRACTIVE OPTICS, AND APPLICATIONS VIII |
卷号 | 10818 |
发表状态 | 已发表 |
DOI | 10.1117/12.2500576 |
摘要 | In this paper, we propose a high-density grating interferometry system, which can be applied to measure displacement on the nanometer precision. We make use of the optical subdivision module to improve the measurement resolution which is better than the traditional one. The core part of the whole system is a grating with high-density of 1780 lines/mm and long-range of 100mm*100mm. The apparatus adopts a symmetrical structure to reduce the error resulting from environmental disturbance. The system provides a novel measurement technique to improve the grating interferometry. The experimental results show that the grating interferometer system has good stability, and the in-situ measurement error is within +/- 5 nm for a long time. The grating interferometer can measure the short distance displacement of 30 nm and can control the error within +/- 2 nm. The measurement of the distance of 10 mm can control the error within +/- 20 nm. The results proves the feasibility of our proposed improved. |
关键词 | grating ruler high optical subdivision high density |
出版地 | 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA |
会议地点 | Beijing, China |
收录类别 | EI ; CPCI-S ; CPCI |
语种 | 英语 |
资助项目 | Chinese Academy of Science[QYZDJ-SSW-JSC014] |
WOS研究方向 | Optics |
WOS类目 | Optics |
WOS记录号 | WOS:000455784500045 |
出版者 | SPIE-INT SOC OPTICAL ENGINEERING |
EI入藏号 | 20190106346385 |
EI主题词 | Errors ; Interferometers |
EI分类号 | Optical Instruments:941.3 |
原始文献类型 | Proceedings Paper |
引用统计 | 正在获取...
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文献类型 | 会议论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/30172 |
专题 | 物质科学与技术学院_硕士生 物质科学与技术学院_特聘教授组_周常河组 |
通讯作者 | Zhou, Changhe |
作者单位 | 1.Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Lab Informat Opt & Optoelect Technol, Shanghai 201800, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 3.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China |
第一作者单位 | 物质科学与技术学院 |
推荐引用方式 GB/T 7714 | Zhu, Shiyao,Zhou, Changhe,Li, Minkang,et al. Grating Interferometry with High Optical Subdivision[C]. 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA:SPIE-INT SOC OPTICAL ENGINEERING,2018. |
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