HOW TO EXPLOIT MOBILITY TO MITIGATE PILOT CONTAMINATION?
2018
会议录名称2018 IEEE GLOBAL CONFERENCE ON SIGNAL AND INFORMATION PROCESSING (GLOBALSIP 2018)
页码166-170
发表状态已发表
DOI10.1109/GlobalSIP.2018.8646433
摘要To tackle the uplink pilot contamination problem in massive multiple-input multiple-output (MIMO) systems, current researches only relied on the angle of arrival at the base station. However, this information is insufficient when the users share the same scattering environment. In this paper, we propose a novel strategy by exploiting the user mobility. Due to limited scatterers around the users, we first investigate the channel sparsity and derive the corresponding angle-Doppler frequency domain channel power spectrum (AD-CPS). We then propose a method to mitigate the pilot contamination through aligning the AD-CPSs. Compared with the existing works, we further demonstrate the effectiveness of the proposed scheme in supporting more orthogonal pilots when the interfering users exhibit different moving patterns. Simulations verify the superior performance and show that the proposed scheme can serve as an additional decontamination mechanism for the UL pilots in massive MIMO systems.
关键词Massive MIMO pilot contamination time-division duplexing Doppler power spectrum channel sparsity
出版地345 E 47TH ST, NEW YORK, NY 10017 USA
会议地点Anaheim, CA, USA
会议日期26-29 Nov. 2018
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收录类别CPCI ; CPCI-S ; EI
语种英语
WOS研究方向Engineering
WOS类目Engineering, Electrical & Electronic
WOS记录号WOS:000462968100034
出版者IEEE
EI入藏号20191206664553
EI主题词Contamination ; Frequency domain analysis ; Power spectrum
EI分类号Mathematical Transformations:921.3
原始文献类型Proceedings Paper
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文献类型会议论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/29136
专题信息科学与技术学院_硕士生
信息科学与技术学院_PI研究组_罗喜良组
信息科学与技术学院_PI研究组_周勇组
信息科学与技术学院_博士生
通讯作者Zhang, Xiaoyu
作者单位
1.ShanghaiTech Univ, Shanghai, Peoples R China
2.Shanghai Adv Res Inst, Shanghai, Peoples R China
第一作者单位上海科技大学
通讯作者单位上海科技大学
第一作者的第一单位上海科技大学
推荐引用方式
GB/T 7714
Zhang, Xiaoyu,Li, Xuanfeng,Zhou, Yong,et al. HOW TO EXPLOIT MOBILITY TO MITIGATE PILOT CONTAMINATION?[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2018:166-170.
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