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ShanghaiTech University Knowledge Management System
Measuring Band Modulation of MoS2 with Ferroelectric Gates | |
2023-03-22 | |
发表期刊 | NANO LETTERS (IF:9.6[JCR-2023],10.1[5-Year]) |
ISSN | 1530-6984 |
EISSN | 1530-6992 |
卷号 | 23期号:6页码:2114–2120 |
发表状态 | 已发表 |
DOI | 10.1021/acs.nanolett.2c04326 |
摘要 | Electronic properties of two-dimensional (2D) materials can be significantly tuned by an external electric field. Ferroelectric gates can provide a strong polarization electric field. Here, we report the measurements of the band structure of few-layer MoS2 modulated by a ferroelectric P(VDF-TrFE) gate with contact-mode scanning tunneling spectroscopy. When P(VDF-TrFE) is fully polarized, an electric field up to ∼0.62 V/nm through the MoS2 layers is inferred from the measured band edges, which affects the band structure significantly. First, strong band bending in the vertical direction signifies the Franz-Keldysh effect and a large extension of the optical absorption edge. Photons with energy of half the band gap are still absorbed with 20% of the absorption probability of photons at the band gap. Second, the electric field greatly enlarges the energy separations between the quantum-well subbands. Our study intuitively demonstrates the great potential of ferroelectric gates in band structure manipulation of 2D materials. |
关键词 | ferroelectrics two-dimensional material scanning tunneling spectroscopy contact-mode scanning tunneling spectroscopy |
学科领域 | 低维物理 |
学科门类 | 理学::物理学 |
收录类别 | SCI ; SCIE ; EI |
语种 | 英语 |
出版者 | American Chemical Society |
EI入藏号 | 20231113694334 |
EI主题词 | Electronic properties |
EI分类号 | 701.1 Electricity: Basic Concepts and Phenomena ; 708.1 Dielectric Materials ; 712.1 Semiconducting Materials ; 714.2 Semiconductor Devices and Integrated Circuits ; 741.1 Light/Optics ; 931.3 Atomic and Molecular Physics |
原始文献类型 | Journal article (JA) |
引用统计 | 正在获取...
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文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/290007 |
专题 | 物质科学与技术学院 物质科学与技术学院_PI研究组_薛加民组 物质科学与技术学院_博士生 |
共同第一作者 | Chen, Yan |
通讯作者 | Wang, Jianlu; Xue, Jiamin |
作者单位 | 1.School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China 2.Shanghai Frontiers Science Research Base of Intelligent Optoelectronics and Perception, Institute of Optoelectronics, Fudan University, Shanghai 200433, China 3.Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 20083, China 4.International Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan 5.Research Center for Functional Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan |
第一作者单位 | 物质科学与技术学院 |
通讯作者单位 | 物质科学与技术学院 |
第一作者的第一单位 | 物质科学与技术学院 |
推荐引用方式 GB/T 7714 | Sun, Xinzuo,Chen, Yan,Zhao, Dongyang,et al. Measuring Band Modulation of MoS2 with Ferroelectric Gates[J]. NANO LETTERS,2023,23(6):2114–2120. |
APA | Sun, Xinzuo.,Chen, Yan.,Zhao, Dongyang.,Takshi, Taniguchi.,Kenji, Watanabe.,...&Xue, Jiamin.(2023).Measuring Band Modulation of MoS2 with Ferroelectric Gates.NANO LETTERS,23(6),2114–2120. |
MLA | Sun, Xinzuo,et al."Measuring Band Modulation of MoS2 with Ferroelectric Gates".NANO LETTERS 23.6(2023):2114–2120. |
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