Applying Feature Detection to XPCS Image Processing

doi:10.1088/1742-6596/2380/1/012124

	Applying Feature Detection to XPCS Image Processing
	Xu, Yihui1,2 ; Tong, Yajun1,2 ; Hu, Menglu1,2 ; Fan, Jiadong1,2 ; Jiang, Huaidong1,2
	2022
会议录名称	JOURNAL OF PHYSICS: CONFERENCE SERIES
ISSN	1742-6588
卷号	2380
期号	1
DOI	10.1088/1742-6596/2380/1/012124
摘要	Sequential X-ray photon correlation spectroscopy (XPCS) reveals sample dynamics by analyzing a series of coherent scattering images, which is often time-consuming. For applications like real-time XPCS analysis, high efficiency is desired. Pixel binning is a straightforward strategy to reduce the processing time, but over-binning may result in an insufficient signal-to-noise ratio. In this work, feature detection is applied to obtain the optimal binning factor for the XPCS image processing. Results show that under optimal binning, the processing time is reduced by more than one order of magnitude. In addition, it is illustrated that feature detection could potentially be applied to other coherent imaging and scattering techniques such as coherent diffraction imaging (CDI). © Published under licence by IOP Publishing Ltd.
关键词	Coherent scattering Feature extraction Image processing Photon correlation spectroscopy Coherent imaging Features detections Higher efficiency Images processing Orders of magnitude Processing time Real- time Scattering image Straightforward strategy X-ray photon correlation spectroscopy
会议名称	14th International Conference on Synchrotron Radiation Instrumentation, SRI 2021
会议地点	Virtual, Online
会议日期	March 28, 2022 - April 1, 2022
URL	查看原文
收录类别	EI
语种	英语
出版者	Institute of Physics
EI入藏号	20230513457130
EI主题词	Signal to noise ratio
EISSN	1742-6596
EI分类号	711 Electromagnetic Waves ; 716.1 Information Theory and Signal Processing ; 723.2 Data Processing and Image Processing ; 741.1 Light/Optics ; 942.2 Electric Variables Measurements
原始文献类型	Conference article (CA)
文献类型	会议论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/282072
专题	大科学中心_公共科研平台_大科学装置建设部大科学中心_PI研究组_江怀东组
作者单位	1.Center for Transformative Science, ShanghaiTech University, 393 Middle Huaxia Road, Shanghai; 201210, China; 2.Shanghai High Repetition Rate, XFEL and Extreme Light Facility (SHINE), 393 Middle Huaxia Road, Shanghai; 201210, China
第一作者单位	上海科技大学
第一作者的第一单位	上海科技大学
推荐引用方式 GB/T 7714	Xu, Yihui,Tong, Yajun,Hu, Menglu,et al. Applying Feature Detection to XPCS Image Processing[C]:Institute of Physics,2022.