Universal relation between doping content and normal-state resistance in gate voltage tuned ultrathin Bi2Sr2CaCu2 O8+x flakes
2022-09-01
发表期刊PHYSICAL REVIEW B (IF:3.2[JCR-2023],3.3[5-Year])
ISSN2469-9950
EISSN2469-9969
卷号106期号:10
发表状态已发表
DOI10.1103/PhysRevB.106.104509
摘要

Gate voltage tunable ultrathin high-Tc cuprates supply a unique platform to investigate the electronic phase diagram and superconductor-insulator transition. One of the challenges in this field is the precise determination of the doping content in the underdoped nonsuperconducting region. Here we report the discovery of a universal relation between the doping content p and the normal-state resistance at a fixed temperature R(Tf), p=α+βln[1/R(Tf)], in the ultrathin Bi2Sr2CaCu2O8+x flakes. The in-depth analysis shows that the evolution of carrier scattering probability with doping content and the change of effective mass caused by superconductor-insulator transition are two key factors leading to this logarithmic relation. Based on our finding, the more precise electronic phase diagram can be established. In addition, the superconductor-insulator transition is verified to be a quantum phase transition using a finite size scaling analysis. The scaling exponent zν is found to have a close correlation with the disorder levels. The present result provides an important foundation to investigate the fascinating electronic states in the ultra-thin cuprates. © 2022 American Physical Society.

关键词Binary alloys Copper compounds Phase transitions Quantum theory Superconducting materials Ternary alloys Threshold voltage Doping content Electronic phase diagram Fixed temperature Gate voltages High-Tc cuprates Normal-state resistance Precise determinations Superconductor insulator transitions Ultra-thin Voltage-tunable
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收录类别SCI ; SCIE ; EI
语种英语
资助项目National Natural Science Foundation of China[
WOS研究方向Materials Science ; Physics
WOS类目Materials Science, Multidisciplinary ; Physics, Applied ; Physics, Condensed Matter
WOS记录号WOS:000862259700004
出版者American Physical Society
EI入藏号20223812781056
EI主题词Phase diagrams
EI分类号701.1 Electricity: Basic Concepts and Phenomena ; 708.3 Superconducting Materials ; 801.4 Physical Chemistry ; 931.4 Quantum Theory ; Quantum Mechanics
原始文献类型Journal article (JA)
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文献类型期刊论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/235978
专题物质科学与技术学院_博士生
通讯作者Jiang, Da
作者单位
1.Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China
2.CAS Ctr Excellence Superconducting Elect, Shanghai 200050, Peoples R China
3.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China
4.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
5.Brookhaven Natl Lab, Condensed Matter Phys & Mat Sci Dept, Upton, NY 11973 USA
6.Zhejiang Univ Technol, Inst Frontiers & Interdisciplinary Sci, Hangzhou 310014, Peoples R China
第一作者单位物质科学与技术学院
推荐引用方式
GB/T 7714
Wang, Teng,Yu, Aobo,Liu, Yixin,et al. Universal relation between doping content and normal-state resistance in gate voltage tuned ultrathin Bi2Sr2CaCu2 O8+x flakes[J]. PHYSICAL REVIEW B,2022,106(10).
APA Wang, Teng.,Yu, Aobo.,Liu, Yixin.,Gu, Genda.,Peng, Wei.,...&Mu, Gang.(2022).Universal relation between doping content and normal-state resistance in gate voltage tuned ultrathin Bi2Sr2CaCu2 O8+x flakes.PHYSICAL REVIEW B,106(10).
MLA Wang, Teng,et al."Universal relation between doping content and normal-state resistance in gate voltage tuned ultrathin Bi2Sr2CaCu2 O8+x flakes".PHYSICAL REVIEW B 106.10(2022).
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