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Universal relation between doping content and normal-state resistance in gate voltage tuned ultrathin Bi2Sr2CaCu2 O8+x flakes | |
2022-09-01 | |
发表期刊 | PHYSICAL REVIEW B (IF:3.2[JCR-2023],3.3[5-Year]) |
ISSN | 2469-9950 |
EISSN | 2469-9969 |
卷号 | 106期号:10 |
发表状态 | 已发表 |
DOI | 10.1103/PhysRevB.106.104509 |
摘要 | Gate voltage tunable ultrathin high-Tc cuprates supply a unique platform to investigate the electronic phase diagram and superconductor-insulator transition. One of the challenges in this field is the precise determination of the doping content in the underdoped nonsuperconducting region. Here we report the discovery of a universal relation between the doping content p and the normal-state resistance at a fixed temperature R(Tf), p=α+βln[1/R(Tf)], in the ultrathin Bi2Sr2CaCu2O8+x flakes. The in-depth analysis shows that the evolution of carrier scattering probability with doping content and the change of effective mass caused by superconductor-insulator transition are two key factors leading to this logarithmic relation. Based on our finding, the more precise electronic phase diagram can be established. In addition, the superconductor-insulator transition is verified to be a quantum phase transition using a finite size scaling analysis. The scaling exponent zν is found to have a close correlation with the disorder levels. The present result provides an important foundation to investigate the fascinating electronic states in the ultra-thin cuprates. © 2022 American Physical Society. |
关键词 | Binary alloys Copper compounds Phase transitions Quantum theory Superconducting materials Ternary alloys Threshold voltage Doping content Electronic phase diagram Fixed temperature Gate voltages High-Tc cuprates Normal-state resistance Precise determinations Superconductor insulator transitions Ultra-thin Voltage-tunable |
URL | 查看原文 |
收录类别 | SCI ; SCIE ; EI |
语种 | 英语 |
资助项目 | National Natural Science Foundation of China[ |
WOS研究方向 | Materials Science ; Physics |
WOS类目 | Materials Science, Multidisciplinary ; Physics, Applied ; Physics, Condensed Matter |
WOS记录号 | WOS:000862259700004 |
出版者 | American Physical Society |
EI入藏号 | 20223812781056 |
EI主题词 | Phase diagrams |
EI分类号 | 701.1 Electricity: Basic Concepts and Phenomena ; 708.3 Superconducting Materials ; 801.4 Physical Chemistry ; 931.4 Quantum Theory ; Quantum Mechanics |
原始文献类型 | Journal article (JA) |
引用统计 | 正在获取...
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文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/235978 |
专题 | 物质科学与技术学院_博士生 |
通讯作者 | Jiang, Da |
作者单位 | 1.Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China 2.CAS Ctr Excellence Superconducting Elect, Shanghai 200050, Peoples R China 3.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China 4.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 5.Brookhaven Natl Lab, Condensed Matter Phys & Mat Sci Dept, Upton, NY 11973 USA 6.Zhejiang Univ Technol, Inst Frontiers & Interdisciplinary Sci, Hangzhou 310014, Peoples R China |
第一作者单位 | 物质科学与技术学院 |
推荐引用方式 GB/T 7714 | Wang, Teng,Yu, Aobo,Liu, Yixin,et al. Universal relation between doping content and normal-state resistance in gate voltage tuned ultrathin Bi2Sr2CaCu2 O8+x flakes[J]. PHYSICAL REVIEW B,2022,106(10). |
APA | Wang, Teng.,Yu, Aobo.,Liu, Yixin.,Gu, Genda.,Peng, Wei.,...&Mu, Gang.(2022).Universal relation between doping content and normal-state resistance in gate voltage tuned ultrathin Bi2Sr2CaCu2 O8+x flakes.PHYSICAL REVIEW B,106(10). |
MLA | Wang, Teng,et al."Universal relation between doping content and normal-state resistance in gate voltage tuned ultrathin Bi2Sr2CaCu2 O8+x flakes".PHYSICAL REVIEW B 106.10(2022). |
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