Large spectral bandwidth (0.9-2.8 mu m) response calibration based on the standard detector
2015-08
会议录名称2015 OPTOELECTRONICS GLOBAL CONFERENCE (OGC)
页码1-4
发表状态已发表
DOI10.1109/OGC.2015.7336869
摘要

Accurate response spectrum is an important parameter of the photoelectric detectors, for it not only can be used to calculate quantum efficiency and detectivity, but also it is useful in application area especially in remote sensing. In this paper, in order to obtain accurate response spectrum at large spectral bandwidth (0.9-2.8 mu m) of the short-wavelength InGaAs measurement detector, benchmark transfer method was proposed, and the grating spectrum monochrometer and Fourier Transform Infrared (FTIR) Spectrometer were used to measure the under-test detector and standard detector for checking the reliability of benchmark transfer method. The results indicate that the response spectrum can be calculated accurately.

关键词Spectrum calibration FTIR Spectrometer Standard detector grating monochrometer
出版地345 E 47TH ST, NEW YORK, NY 10017 USA
会议地点Shenzhen
会议日期29-31 Aug. 2015
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收录类别EI ; CPCI
语种英语
WOS研究方向Engineering ; Optics
WOS类目Engineering, Electrical & Electronic ; Optics
WOS记录号WOS:000378318500047
出版者IEEE
EI入藏号20161302149451
EI主题词Calibration ; Fourier transform infrared spectroscopy ; Optoelectronic devices ; Remote sensing ; Spectrometers
EI分类号Information Theory and Signal Processing:716.1 ; Optical Devices and Systems:741.3 ; Chemistry:801
原始文献类型Proceedings Paper
来源库IEEE
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文献类型会议论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/2289
专题物质科学与技术学院
物质科学与技术学院_硕士生
作者单位
1.School of Physical Science and Technology, ShanghaiTech University, Shanghai, P.R. China
2.Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics CAS, Shanghai, P.R. China
3.State Key Laboratories of Transducer Technology, Shanghai Institute of Technical Physics CAS, Shanghai, P.R. China
第一作者单位物质科学与技术学院
第一作者的第一单位物质科学与技术学院
推荐引用方式
GB/T 7714
Qingfa Li,Xue Li,Hengjing Tang,et al. Large spectral bandwidth (0.9-2.8 mu m) response calibration based on the standard detector[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2015:1-4.
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