A resonant cantilever based particle sensor with particle-size selection function
2018-08
发表期刊JOURNAL OF MICROMECHANICS AND MICROENGINEERING (IF:2.4[JCR-2023],2.0[5-Year])
ISSN0960-1317
卷号28期号:8
发表状态已发表
DOI10.1088/1361-6439/aabdac
摘要This paper reports on a novel resonant-gravimetric micro-cantilever based particle sensor for detecting particles (e.g. PM2.5) in air. A row of micro-pillars with desired separation-distance are integrated in a micro-channel that is embedded in the cantilever as a filter to select the particles of desired size. When particles containing air are pumped into the micro-channel, the particles with desired diameters are trapped by the micro-pillars near the free-end of the cantilever, which results in a detectable resonant frequency shift of the micro-cantilever. After detection the sensor can be recovered by reversing the direction of the air flow to blow off the trapped particles and the sensor is ready for the next detection. By tuning the spacing between the barrier bars, the diameters of the trapped particles can be customized for specific detection applications. The complicated structure of the resonant sensor is fabricated by using a novel IC-foundry compatible single-sided surface micromachining technique, with singleside-polished (1 1 1) silicon wafers on a low-cost non-SOI substrate. The sensor prototype has experimentally exhibited excellent real-time detection performance to standard polystyrene micro-spheres, with the resolution of the single particle being distinguishable. The sensor is promising in applications of air pollution monitoring and analysis.
关键词particle sensor single-sided micromachining process particle-size filter and selection flow micro-channel integrated resonant cantilever
收录类别SCI ; SCIE ; EI
语种英语
资助项目Youth Innovation Promotion Association CAS[2017278]
WOS研究方向Engineering ; Science & Technology - Other Topics ; Instruments & Instrumentation ; Physics
WOS类目Engineering, Electrical & Electronic ; Nanoscience & Nanotechnology ; Instruments & Instrumentation ; Physics, Applied
WOS记录号WOS:000432432100001
出版者IOP PUBLISHING LTD
EI入藏号20182305290195
EI主题词Composite micromechanics ; Ion beams ; Natural frequencies ; Particle size ; Silicon wafers ; Surface micromachining
EI分类号Semiconductor Devices and Integrated Circuits:714.2 ; Nanotechnology:761 ; Mechanics:931.1 ; High Energy Physics:932.1 ; Solid State Physics:933
WOS关键词CRYSTALLINE-SILICON ; MASS CONCENTRATION ; NANOPARTICLES ; EXPOSURE ; CHIP
原始文献类型Article
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文献类型期刊论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/20865
专题信息科学与技术学院
信息科学与技术学院_特聘教授组_李昕欣组
信息科学与技术学院_博士生
通讯作者Li, Xinxin
作者单位
1.Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, State Key Lab Transducer Technol, Shanghai 200050, Peoples R China
2.ShanghaiTech Univ, Sch Informat Sci & Technol, Shanghai 201210, Peoples R China
3.Univ Chinese Acad Sci, Huairou 101408, Peoples R China
第一作者单位信息科学与技术学院
通讯作者单位信息科学与技术学院
推荐引用方式
GB/T 7714
Bao, Yuyang,Cai, Shengran,Yu, Haitao,et al. A resonant cantilever based particle sensor with particle-size selection function[J]. JOURNAL OF MICROMECHANICS AND MICROENGINEERING,2018,28(8).
APA Bao, Yuyang,Cai, Shengran,Yu, Haitao,Xu, Tiegang,Xu, Pengcheng,&Li, Xinxin.(2018).A resonant cantilever based particle sensor with particle-size selection function.JOURNAL OF MICROMECHANICS AND MICROENGINEERING,28(8).
MLA Bao, Yuyang,et al."A resonant cantilever based particle sensor with particle-size selection function".JOURNAL OF MICROMECHANICS AND MICROENGINEERING 28.8(2018).
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