Short-Wave Infrared Chip-Spectrometer by Using Laser Direct-Writing Grayscale Lithography
2022-10-04
发表期刊ADVANCED OPTICAL MATERIALS (IF:8.0[JCR-2023],9.0[5-Year])
ISSN2195-1071
发表状态已发表
DOI10.1002/adom.202200284
摘要

Short-wave infrared (SWIR) information is critical for material analysis, imaging sensing, and other fields. To acquire SWIR spectrum with compact devices, strategies for reconstructive microspectrometer have emerged, such as photonic crystal and quantum dot filter. However, the current SWIR microspectrometer needs many filters with insufficient resolution. In this work, the authors develop a SWIR chip-spectrometer based on Fabry-Perot microcavities array which can be fabricated by using fast and low-cost UV laser direct-writing grayscale lithography. The ultra-compact chip-spectrometer can work in a very wide range from 900 to 1700 nm with only 20 detector pixels and a reconstruction algorithm. The spectral resolution achieves 2 nm by 50 pixels set and 5 nm by 20 pixels set at SWIR range, which is 3 times higher, with 3.9 times less units number, than for recently reported SWIR quantum dot spectrometers. To the best of our knowledge, this is a minimum high-resolution SWIR InGaAs detector based chip-spectrometer which can work in the whole SWIR band with only 20 detector pixels. It has great potential for applications in smart-phone or other miniature portable spectrometers.

关键词grayscale lithography short-wave infrared micro-nano photonic devices microspectrometer on-chip
收录类别SCI ; SCIE ; EI
语种英语
资助项目National Key R&D Program of China[2021YFA0715500] ; National Natural Science Foundation of China (NSFC)[11874376] ; Shanghai Science and Technology Foundations[19DZ2293400] ; Shanghai Municipal Science and Technology Major Project[2019SHZDZX01] ; Chinese Academy of Sciences President's International Fellowship Initiative[2021PT0007] ; Analytical Instrumentation Center[SPST-AIC10112914] ; Soft Matter Nanofab[SMN180827]
WOS研究方向Materials Science ; Optics
WOS类目Materials Science, Multidisciplinary ; Optics
WOS记录号WOS:000827063700001
出版者WILEY-V C H VERLAG GMBH
引用统计
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文献类型期刊论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/206354
专题物质科学与技术学院_博士生
信息科学与技术学院
物质科学与技术学院_特聘教授组_陆卫组
信息科学与技术学院_PI研究组_虞晶怡组
信息科学与技术学院_博士生
通讯作者Wang, Shaowei
作者单位
1.State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai; 200083, China;
2.School of Physical Science and Technology, ShanghaiTech University, Shanghai; 201210, China;
3.University of Chinese Academy of Sciences, Beijing; 100049, China;
4.Shanghai Research Center for Quantum Sciences, Shanghai; 201315, China;
5.School of Information Science and Technology, ShanghaiTech University, Shanghai; 201210, China;
6.State Key Laboratories of Transducer Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai; 200083, China
第一作者单位物质科学与技术学院
推荐引用方式
GB/T 7714
Xuan, Zhiyi,Wang, Zi,Liu, Qingquan,et al. Short-Wave Infrared Chip-Spectrometer by Using Laser Direct-Writing Grayscale Lithography[J]. ADVANCED OPTICAL MATERIALS,2022.
APA Xuan, Zhiyi.,Wang, Zi.,Liu, Qingquan.,Huang, Songlei.,Yang, Bo.,...&Lu, Wei.(2022).Short-Wave Infrared Chip-Spectrometer by Using Laser Direct-Writing Grayscale Lithography.ADVANCED OPTICAL MATERIALS.
MLA Xuan, Zhiyi,et al."Short-Wave Infrared Chip-Spectrometer by Using Laser Direct-Writing Grayscale Lithography".ADVANCED OPTICAL MATERIALS (2022).
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