ShanghaiTech University Knowledge Management System
Short-Wave Infrared Chip-Spectrometer by Using Laser Direct-Writing Grayscale Lithography | |
2022-10-04 | |
发表期刊 | ADVANCED OPTICAL MATERIALS (IF:8.0[JCR-2023],9.0[5-Year]) |
ISSN | 2195-1071 |
发表状态 | 已发表 |
DOI | 10.1002/adom.202200284 |
摘要 | Short-wave infrared (SWIR) information is critical for material analysis, imaging sensing, and other fields. To acquire SWIR spectrum with compact devices, strategies for reconstructive microspectrometer have emerged, such as photonic crystal and quantum dot filter. However, the current SWIR microspectrometer needs many filters with insufficient resolution. In this work, the authors develop a SWIR chip-spectrometer based on Fabry-Perot microcavities array which can be fabricated by using fast and low-cost UV laser direct-writing grayscale lithography. The ultra-compact chip-spectrometer can work in a very wide range from 900 to 1700 nm with only 20 detector pixels and a reconstruction algorithm. The spectral resolution achieves 2 nm by 50 pixels set and 5 nm by 20 pixels set at SWIR range, which is 3 times higher, with 3.9 times less units number, than for recently reported SWIR quantum dot spectrometers. To the best of our knowledge, this is a minimum high-resolution SWIR InGaAs detector based chip-spectrometer which can work in the whole SWIR band with only 20 detector pixels. It has great potential for applications in smart-phone or other miniature portable spectrometers. |
关键词 | grayscale lithography short-wave infrared micro-nano photonic devices microspectrometer on-chip |
收录类别 | SCI ; SCIE ; EI |
语种 | 英语 |
资助项目 | National Key R&D Program of China[2021YFA0715500] ; National Natural Science Foundation of China (NSFC)[11874376] ; Shanghai Science and Technology Foundations[19DZ2293400] ; Shanghai Municipal Science and Technology Major Project[2019SHZDZX01] ; Chinese Academy of Sciences President's International Fellowship Initiative[2021PT0007] ; Analytical Instrumentation Center[SPST-AIC10112914] ; Soft Matter Nanofab[SMN180827] |
WOS研究方向 | Materials Science ; Optics |
WOS类目 | Materials Science, Multidisciplinary ; Optics |
WOS记录号 | WOS:000827063700001 |
出版者 | WILEY-V C H VERLAG GMBH |
引用统计 | 正在获取...
|
文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/206354 |
专题 | 物质科学与技术学院_博士生 信息科学与技术学院 物质科学与技术学院_特聘教授组_陆卫组 信息科学与技术学院_PI研究组_虞晶怡组 信息科学与技术学院_博士生 |
通讯作者 | Wang, Shaowei |
作者单位 | 1.State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai; 200083, China; 2.School of Physical Science and Technology, ShanghaiTech University, Shanghai; 201210, China; 3.University of Chinese Academy of Sciences, Beijing; 100049, China; 4.Shanghai Research Center for Quantum Sciences, Shanghai; 201315, China; 5.School of Information Science and Technology, ShanghaiTech University, Shanghai; 201210, China; 6.State Key Laboratories of Transducer Technology, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai; 200083, China |
第一作者单位 | 物质科学与技术学院 |
推荐引用方式 GB/T 7714 | Xuan, Zhiyi,Wang, Zi,Liu, Qingquan,et al. Short-Wave Infrared Chip-Spectrometer by Using Laser Direct-Writing Grayscale Lithography[J]. ADVANCED OPTICAL MATERIALS,2022. |
APA | Xuan, Zhiyi.,Wang, Zi.,Liu, Qingquan.,Huang, Songlei.,Yang, Bo.,...&Lu, Wei.(2022).Short-Wave Infrared Chip-Spectrometer by Using Laser Direct-Writing Grayscale Lithography.ADVANCED OPTICAL MATERIALS. |
MLA | Xuan, Zhiyi,et al."Short-Wave Infrared Chip-Spectrometer by Using Laser Direct-Writing Grayscale Lithography".ADVANCED OPTICAL MATERIALS (2022). |
条目包含的文件 | ||||||
文件名称/大小 | 文献类型 | 版本类型 | 开放类型 | 使用许可 |
修改评论
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。