Hard X-Ray Bent Crystal Spectrometer with High Energy Resolution

doi:10.3788/AOS202242.1134018

	Hard X-Ray Bent Crystal Spectrometer with High Energy Resolution
	Yang, Zhicheng 1,2,4; Li, Bin1,2,3,4
	2022-06-10
发表期刊	光学学报 (IF:1.6[JCR-2023],1.1[5-Year])
ISSN	0253-2239
卷号	42 期号:11
发表状态	已发表
DOI	10.3788/AOS202242.1134018
摘要	Based on design algorithms of hard X-ray spectrometers in advanced light sources around the world, high energy resolution is realized by adopting cylindrically bent Bragg crystals. A new structure of a double diffraction spectrometer is proposed, which can achieve 2×105 energy resolution of single pulse in the photon energy range of 325 keV. The energy resolution performance of the spectrometer is verified by theoretical analysis and numerical calculation. And a broad spectrum with bandwidth beyond 1% can be reconstructed via mechanical scan. This technique can potentially be used to measure the fine structure in self-amplified spontaneous emission (SASE) spectra within hard X-ray spectral range for Shanghai High Repetition Rate hard X-ray free electron laser (XFEL) and Extreme Light Facility (SHINE), and it can be applied to detection and application of the cutting edge user scientific researches demanding high resolving power, preserving important merit of value in science and technology. © 2022, Chinese Lasers Press. All right reserved.
关键词	Crystals Electrons Free electron lasers Energy resolutions Hard X ray Hard X-ray free electron laser High-energy resolution On-line measurement Single shot online measurement Single-shot Strongly bend cylindrical crystal X-ray free electron lasers X-ray optics
收录类别	EI ; 北大核心
语种	中文
出版者	Chinese Optical Society
EI入藏号	20222812347927
EI主题词	Spectrometers
EI分类号	741.3 Optical Devices and Systems ; 744.5 Free Electron Lasers ; 933.1 Crystalline Solids
原始文献类型	Journal article (JA)
文献类型	期刊论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/206302
专题	物质科学与技术学院_特聘教授组_李宾组
通讯作者	Li, Bin
作者单位	1.Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai; 201800, China; 2.Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai; 201204, China; 3.School of Physical Science and Technology, Shanghai Tech University, Shanghai; 201210, China; 4.University of Chinese Academy of Sciences, Beijing; 100049, China
通讯作者单位	物质科学与技术学院
推荐引用方式 GB/T 7714	Yang, Zhicheng,Li, Bin. Hard X-Ray Bent Crystal Spectrometer with High Energy Resolution[J]. 光学学报,2022,42(11).
APA	Yang, Zhicheng,&Li, Bin.(2022).Hard X-Ray Bent Crystal Spectrometer with High Energy Resolution.光学学报,42(11).
MLA	Yang, Zhicheng,et al."Hard X-Ray Bent Crystal Spectrometer with High Energy Resolution".光学学报 42.11(2022).