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ShanghaiTech University Knowledge Management System
Observation of non-trivial topological electronic structure of orthorhombic SnSe | |
Zheng, H. J.1,2 ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() ![]() | |
2022-05 | |
发表期刊 | PHYSICAL REVIEW MATERIALS (IF:3.1[JCR-2023],3.4[5-Year]) |
ISSN | 2475-9953 |
卷号 | 6期号:5 |
发表状态 | 已发表 |
DOI | 10.1103/PhysRevMaterials.6.054201 |
摘要 | Topological electronic structures are key to the topological classification of quantum materials and play an important role in their physical properties and applications. Recently, SnSe has attracted great research interest due to its superior thermoelectric performance. However, its topological nature has long been ignored. In this work, by combining synchrotron-based angle-resolved photoemission spectroscopy and ab initio calculations, we systematically investigate the topological electronic structure of orthorhombic SnSe. By identifying the continuous gap in the valence bands due to the band inversion and the topological surface states on its (001) surface, we establish SnSe as a strong topological insulator. Furthermore, we study the evolution of the topological electronic structure and propose the topological phase diagram in SnSe1-xTex. Our work reveals the topological nontrivial nature of SnSe and provides understandings of its intriguing transport properties. |
URL | 查看原文 |
收录类别 | SCI ; EI ; SCIE |
语种 | 英语 |
资助项目 | National Key R&D Program of China[2017YFA0305400] |
WOS研究方向 | Materials Science |
WOS类目 | Materials Science, Multidisciplinary |
WOS记录号 | WOS:000799575500001 |
出版者 | AMER PHYSICAL SOC |
引用统计 | 正在获取...
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文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/178427 |
专题 | 物质科学与技术学院_博士生 物质科学与技术学院_PI研究组_米启兮组 物质科学与技术学院_PI研究组_柳仲楷组 物质科学与技术学院_PI研究组_郭艳峰组 物质科学与技术学院_特聘教授组_陈宇林 物质科学与技术学院_硕士生 物质科学与技术学院_公共科研平台_拓扑物理实验室 大科学中心 |
通讯作者 | Liu, Z. K. |
作者单位 | 1.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 3.ShanghaiTech Univ, Ctr Transformat Sci, Shanghai 201210, Peoples R China 4.ShanghaiTech Univ, Shanghai High Repetit Rate XFEL & Extreme Light F, Shanghai 201210, Peoples R China 5.Nanjing Univ, Natl Lab Solid State Microstruct, Dept Phys, Dept Mat Sci & Engn, Nanjing 210093, Peoples R China 6.Nanjing Univ, Collaborat Innovat Ctr Adv Microstruct, Nanjing 210093, Peoples R China 7.ShanghaiTech Lab Topol Phys, Shanghai 201210, Peoples R China 8.Univ Oxford, Dept Phys, Oxford OX1 3PU, England 9.Univ Sci & Technol China, Natl Synchrotron Radiat Lab, Hefei 230026, Anhui, Peoples R China 10.Lawrence Berkeley Natl Lab, Adv Light Source, Berkeley, CA 94720 USA 11.Tsinghua Univ, Dept Phys, State Key Lab Low Dimens Quantum Phys, Beijing 100084, Peoples R China 12.Univ Manchester, Dept Phys & Astron, Manchester M13 9PL, Lancs, England |
第一作者单位 | 物质科学与技术学院 |
通讯作者单位 | 物质科学与技术学院; 上海科技大学 |
第一作者的第一单位 | 物质科学与技术学院 |
推荐引用方式 GB/T 7714 | Zheng, H. J.,Shi, W. J.,Wang, C. W.,et al. Observation of non-trivial topological electronic structure of orthorhombic SnSe[J]. PHYSICAL REVIEW MATERIALS,2022,6(5). |
APA | Zheng, H. J..,Shi, W. J..,Wang, C. W..,Lv, Y. Y..,Xia, W..,...&Chen, Y. L..(2022).Observation of non-trivial topological electronic structure of orthorhombic SnSe.PHYSICAL REVIEW MATERIALS,6(5). |
MLA | Zheng, H. J.,et al."Observation of non-trivial topological electronic structure of orthorhombic SnSe".PHYSICAL REVIEW MATERIALS 6.5(2022). |
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