Dispersed SiC nanoparticles in Ni observed by ultra-small-angle X-ray scattering

doi:10.1107/S1600576716015090

	Dispersed SiC nanoparticles in Ni observed by ultra-small-angle X-ray scattering
	Xie, R.1; Ilavsky, J.2; Huang, H. F.1; Zhou, X. L.1,3 ; Yang, C.1; Wang, Y. Z.4; Xu, H. J.1
	2016-12
发表期刊	JOURNAL OF APPLIED CRYSTALLOGRAPHY (IF:5.2[JCR-2023],5.0[5-Year])
ISSN	1600-5767
卷号	49 期号:6 页码:2155-2160
发表状态	已发表
DOI	10.1107/S1600576716015090
摘要	A metal-ceramic composite, nickel reinforced with SiC nanoparticles, was synthesized and characterized for its potential application in next-generation molten salt nuclear reactors. Synchrotron ultra-small-angle X-ray scattering (USAXS) measurements were conducted on the composite. The size distribution and number density of the SiC nanoparticles in the material were obtained through data modelling. Scanning and transmission electron microscopy characterization were performed to substantiate the results of the USAXS measurements. Tensile tests were performed on the samples to measure the change in their yield strength after doping with the nanoparticles. The average interparticle distance was calculated from the USAXS results and is related to the increased yield strength of the composite.
关键词	ultra-small-angle X-ray scattering (USAXS) nanoparticle-reinforced metals nuclear materials Ni-SiC
收录类别	SCI ; EI
语种	英语
资助项目	DOE Office of Science[DE-AC02-06CH11357]
WOS研究方向	Chemistry ; Crystallography
WOS类目	Chemistry, Multidisciplinary ; Crystallography
WOS记录号	WOS:000391195900032
出版者	INT UNION CRYSTALLOGRAPHY
EI入藏号	20165003120553
EI主题词	Characterization ; High resolution transmission electron microscopy ; Metal nanoparticles ; Nanoparticles ; Nickel ; Nuclear reactors ; Radioactive materials ; Reinforcement ; Scanning electron microscopy ; Silicon carbide ; Synthesis (chemical) ; Tensile testing ; Transmission electron microscopy ; Yield stress
EI分类号	Nickel:548.1 ; Radioactive Materials, General:622.1 ; Optical Devices and Systems:741.3 ; Nanotechnology:761 ; Chemical Reactions:802.2 ; Inorganic Compounds:804.2 ; High Energy Physics:932.1 ; Materials Science:951
WOS关键词	ADVANCED PHOTON SOURCE ; BEHAVIOR ; COMPOSITE ; ALLOYS ; PHASE
原始文献类型	Article
引用统计	正在获取...
文献类型	期刊论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/1611
专题	物质科学与技术学院物质科学与技术学院_硕士生
通讯作者	Xie, R.
作者单位	1.Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai 201800, Peoples R China 2.Argonne Natl Lab, Adv Photon Source, Xray Sci Div, Argonne, IL 60439 USA 3.ShanghaiTech Univ, Shanghai 201210, Peoples R China 4.Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Shanghai 201204, Peoples R China
推荐引用方式 GB/T 7714	Xie, R.,Ilavsky, J.,Huang, H. F.,et al. Dispersed SiC nanoparticles in Ni observed by ultra-small-angle X-ray scattering[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY,2016,49(6):2155-2160.
APA	Xie, R..,Ilavsky, J..,Huang, H. F..,Zhou, X. L..,Yang, C..,...&Xu, H. J..(2016).Dispersed SiC nanoparticles in Ni observed by ultra-small-angle X-ray scattering.JOURNAL OF APPLIED CRYSTALLOGRAPHY,49(6),2155-2160.
MLA	Xie, R.,et al."Dispersed SiC nanoparticles in Ni observed by ultra-small-angle X-ray scattering".JOURNAL OF APPLIED CRYSTALLOGRAPHY 49.6(2016):2155-2160.