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Thermal stability of iron silicide nanowires epitaxially grown on Si(110) substrates | |
2017-03-31 | |
发表期刊 | APPLIED SURFACE SCIENCE (IF:6.3[JCR-2023],5.9[5-Year]) |
ISSN | 0169-4332 |
卷号 | 399页码:200-204 |
发表状态 | 已发表 |
DOI | 10.1016/j.apsusc.2016.12.056 |
摘要 | Metallic alpha-FeSi2 nanowires (NWs) are epitaxially grown on Si(110) at 650 degrees C Their evolution as a function of annealing temperature has been studied in situ by scanning tunneling microscopy. The NWs are stable up to 750 degrees C, which is much lower than that of the bulk alpha-FeSi2. With further increasing the annealing temperature, some NWs begin to shrink in length and transform into wider and higher semiconducting beta-FeSi2 nanorods or three-dimensional (3D) islands at 925 degrees C. The phase transformation is driven by the reduction in surface energy. On the other hand, some beta-FeSi2 NWs begin to dissolve and become thinner until disappearing. The growth of the beta-FeSi2 nanorods or 3D nanocrystals follows the Ostwald ripening mechanism, i.e., the large islands grow in size at the expense of the small ones. X-ray photoelectron spectroscopy study shows that the Fe 2p peaks of beta-FeSi2 nanocrystals exhibit a negative shift of 0.2 eV with respect to the alpha-FeSi2 NWs. (C) 2016 Elsevier B.V. All rights reserved. |
关键词 | Nanowires Epitaxial growth Scanning tunneling microscopy Thermal stability Phase transformation |
收录类别 | SCI ; EI |
语种 | 英语 |
资助项目 | Innovation Program of Shanghai Municipal Education Commission[12ZZ025] |
WOS研究方向 | Chemistry ; Materials Science ; Physics |
WOS类目 | Chemistry, Physical ; Materials Science, Coatings & Films ; Physics, Applied ; Physics, Condensed Matter |
WOS记录号 | WOS:000393001700022 |
出版者 | ELSEVIER SCIENCE BV |
EI入藏号 | 20165203167970 |
EI主题词 | Epitaxial growth ; Nanocrystals ; Nanorods ; Nanowires ; Ostwald ripening ; Phase transitions ; Scanning tunneling microscopy ; Silicides ; Thermodynamic stability |
EI分类号 | Thermodynamics:641.1 ; Nanotechnology:761 ; Physical Chemistry:801.4 ; Chemical Products Generally:804 ; Solid State Physics:933 ; Crystal Growth:933.1.2 |
WOS关键词 | ELECTRONIC-PROPERTIES ; FESI2 ; SPECTROSCOPY ; BETA-FESI2 ; MOSSBAUER ; SURFACES ; SI(001) |
原始文献类型 | Article |
引用统计 | 正在获取...
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文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/1452 |
专题 | 物质科学与技术学院_公共科研平台_分析测试平台 |
通讯作者 | Zou, Zhi-Qiang |
作者单位 | 1.ShanghaiTech Univ, Sch Phys Sci & Technol, 100 Haike Rd, Shanghai 201210, Peoples R China 2.Shanghai Jiao Tong Univ, Analyt & Testing Ctr, 800 Dongchuan Rd, Shanghai 200240, Peoples R China |
第一作者单位 | 物质科学与技术学院 |
通讯作者单位 | 物质科学与技术学院 |
第一作者的第一单位 | 物质科学与技术学院 |
推荐引用方式 GB/T 7714 | Zou, Zhi-Qiang,Li, Xu,Liu, Xiao-Yong,et al. Thermal stability of iron silicide nanowires epitaxially grown on Si(110) substrates[J]. APPLIED SURFACE SCIENCE,2017,399:200-204. |
APA | Zou, Zhi-Qiang,Li, Xu,Liu, Xiao-Yong,Shi, Kai-Juan,&Guo, Xin-Qiu.(2017).Thermal stability of iron silicide nanowires epitaxially grown on Si(110) substrates.APPLIED SURFACE SCIENCE,399,200-204. |
MLA | Zou, Zhi-Qiang,et al."Thermal stability of iron silicide nanowires epitaxially grown on Si(110) substrates".APPLIED SURFACE SCIENCE 399(2017):200-204. |
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