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Neutron irradiation and polarization effect of 4H–SiC Schottky detector
期刊论文
NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH, SECTION A: ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT, 2024, 卷号: 1064
作者:
Long, Ze
;
Xia, Xiaochuan
;
Jiang, Wei
;
Jing, Hantao
;
Zou, Xinbo
Adobe PDF(6826Kb)
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浏览/下载:59/0
  |  
提交时间:2024/04/26
Bias voltage
Capacitance
Electric fields
Gamma rays
Neutrons
Polarization
Silicon carbide
4h–SiC
Charge collection efficiency
Energy resolutions
Fluences
Irradiation effect
Irradiation experiments
Neutron fluences
Polarization effect
Schottky detectors
SiC detectors
Suppressed current collapse and improved threshold voltage stability of AlGaN/GaN HEMT via O2 plasma treatment
期刊论文
MICROELECTRONICS JOURNAL, 2024, 卷号: 148
作者:
Zhu, Yitai
;
Zhang, Yu
;
Qu, Haolan
;
Gao, Han
;
Du, Haitao
Adobe PDF(4805Kb)
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浏览/下载:21/0
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提交时间:2024/06/11
AlGaN/GaN HEMT
O 2 plasma treatment
Current collapse
Threshold voltage shift
Dynamic characteristic
Nonlinear Capacitance Compensation Method for Integrating a Metal-Semiconductor-Metal Varactor with a Gallium Nitride High Electron Mobility Transistor Power Amplifier
期刊论文
ELECTRONICS, 2024, 卷号: 13, 期号: 7
作者:
Li, Ke
;
Gu, Yitian
;
Guo, Haowen
;
Zou, Xinbo
Adobe PDF(9388Kb)
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浏览/下载:30/0
  |  
提交时间:2024/05/14
GaN HEMT
power amplifier
AM-PM distortion
Reliable electrical performance of β-Ga2O3 Schottky barrier diode at cryogenic temperatures
期刊论文
JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY A: VACUUM, SURFACES AND FILMS, 2024, 卷号: 42, 期号: 2
作者:
Qu, Haolan
;
Huang, Wei
;
Zhang, Yu
;
Sui, Jin
;
Chen, Jiaxiang
Adobe PDF(3333Kb)
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浏览/下载:76/0
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提交时间:2024/02/23
Carrier concentration
Cryogenics
Gallium compounds
Semiconductor metal boundaries
Temperature distribution
Blocking performance
Cryogenic temperatures
Dynamic performance
Electrical performance
Ideality factors
Lows-temperatures
Off state
Schottky characteristics
Temperature dependence
Temperature rise
Relaxation kinetics of interface states and bulk traps in atomic layer deposited ZrO2/β-Ga2O3 metal-oxide-semiconductor capacitors
期刊论文
JOURNAL OF APPLIED PHYSICS, 2024, 卷号: 135, 期号: 8
作者:
Chen, Jiaxiang
;
Qu, Haolan
;
Sui, Jin
;
Lu, Xing
;
Zou, Xinbo
Adobe PDF(3256Kb)
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浏览/下载:101/15
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提交时间:2024/03/22
Atomic layer deposition
Capacitance
Electric fields
Gallium compounds
MOS capacitors
Oxide semiconductors
Transistors
Zirconia
Atomic layer deposited
Bulk traps
Comprehensive analysis
Device instabilities
Emission behavior
Forward bias
Interfaces state
Metal-oxide semiconductor devices
Metal-oxide- semiconductorcapacitors
Relaxation kinetics
Emission and capture characteristics of deep hole trap in n-GaN by optical deep level transient spectroscopy
期刊论文
JOURNAL OF SEMICONDUCTORS, 2024, 卷号: 45, 期号: 3
作者:
Jin Sui
;
Jiaxiang Chen
;
Haolan Qu
;
Yu Zhang
;
Xing Lu
Adobe PDF(4177Kb)
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浏览/下载:67/0
  |  
提交时间:2024/04/06
GaN
deep level transient spectroscopy
minority carrier trap
time constant
trap concentration
Activation energy
Deep level transient spectroscopy
Electric fields
Hole concentration
III-V semiconductors
Laser beams
Schottky barrier diodes
Semiconductor diodes
Wide band gap semiconductors
Activation energy E
Carrier traps
Deep hole trap
Deep levels transient spectroscopy
Emission process
Minority carrier
Minority carrier trap
Optical-
Time-constants
Trap concentration
Acceleration of solving drift-diffusion equations enabled by estimation of initial value at nonequilibrium
期刊论文
NETWORKS AND HETEROGENEOUS MEDIA, 2024, 卷号: 19, 期号: 1, 页码: 456-474
作者:
Du, Chunlin
;
Zhang, Yu
;
Qu, Haolan
;
Guo, Haowen
;
Zou, Xinbo
Adobe PDF(5647Kb)
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浏览/下载:25/0
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提交时间:2024/05/14
drift -di ffusion equations
finite element method
nonlinear iteration
nonequilibrium
initial guess
semiconductor device simulation
Radiation effects of high-fluence reactor neutron on Ni/β-Ga
2
O
3
Schottky barrier diodes
期刊论文
APPLIED PHYSICS LETTERS, 2024, 卷号: 124, 期号: 1
作者:
Zhou, Leidang
;
Chen, Hao
;
Xu, Tongling
;
Ruan, Jinlu
;
Lai, Yuru
Adobe PDF(1Kb)
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浏览/下载:46/0
  |  
提交时间:2024/03/04
Capacitance
Electric resistance
Gallium compounds
Neutron irradiation
Neutrons
Radiation effects
% reductions
Electrical characteristic
Energy spectrum
Fluences
Forward currents
Higher-on resistance
Irradiation effect
Neutron fluences
Orders of magnitude
Reactor neutrons
Dynamic Reliability Assessment of Vertical GaN Trench MOSFETs With Thick Bottom Dielectric
期刊论文
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2024, 卷号: PP, 期号: 99, 页码: 1-1
作者:
Yu Zhang
;
Renqiang Zhu
;
Haolan Qu
;
Yitian Gu
;
Huaxing Jiang
Adobe PDF(1470Kb)
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收藏
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浏览/下载:45/0
  |  
提交时间:2024/06/11
Activation energy
Deep level transient spectroscopy
Dielectric materials
Drain current
Electric fields
Gallium nitride
High electron mobility transistors
III-V semiconductors
MOSFET devices
Stability
Threshold voltage
Current collapse
Dynamic reliability assessment
Dynamics characteristic
Dynamics stability
MOS-FET
MOSFETs
Reference devices
Time resolved measurement
Trench MOSFET
Vertical trench MOSFET
545-mA/mm E-mode Recessed-Gate GaN MOSHEMT (Vth > 4V) by Ion Beam Etching
期刊论文
IEEE ELECTRON DEVICE LETTERS, 2024, 卷号: PP, 期号: 99, 页码: 1-1
作者:
Han Gao
;
Yitian Gu
;
Yu Zhang
;
Jialun Li
;
Junmin Zhou
Adobe PDF(2787Kb)
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浏览/下载:70/0
  |  
提交时间:2024/04/16
Enhancement mode
ion beam etching
MOSHEMT
recessed-gate
normally-off