Meissner effect measurement of single indium particle using a customized on-chip nano-scale superconducting quantum interference device system

doi:10.1038/srep45945

	Meissner effect measurement of single indium particle using a customized on-chip nano-scale superconducting quantum interference device system
	Wu, Long 1,2; Chen, Lei 1,2; Wang, Hao 1,2; Liu, Xiaoyu 1,2; Wang, Zhen1,2,3
	2017-04-04
发表期刊	SCIENTIFIC REPORTS
ISSN	2045-2322
卷号	7
发表状态	已发表
DOI	10.1038/srep45945
摘要	As many emergent phenomena of superconductivity appear on a smaller scale and at lower dimension, commercial magnetic property measurement systems (MPMSs) no longer provide the sensitivity necessary to study the Meissner effect of small superconductors. The nano-scale superconducting quantum interference device (nano-SQUID) is considered one of the most sensitive magnetic sensors for the magnetic characterization of mesoscopic or microscopic samples. Here, we develop a customized on-chip nano-SQUID measurement system based on a pulsed current biasing method. The noise performance of our system is approximately 4.6 x 10(-17) emu/Hz(1/2), representing an improvement of 9 orders of magnitude compared with that of a commercial MPMS (similar to 10(-8) emu/Hz(1/2)). Furthermore, we demonstrate the measurement of the Meissner effect of a single indium (In) particle (of 47 mu m in diameter) using our on-chip nano-SQUID system. The system enables the observation of the prompt superconducting transition of the Meissner effect of a single In particle, thereby providing more accurate characterization of the critical field H-c and temperature T-c. In addition, the retrapping field H-re as a function of temperature T of single In particle shows disparate behavior from that of a large ensemble.
收录类别	SCI
语种	英语
资助项目	National Science Foundation of China[61306151]
WOS研究方向	Science & Technology - Other Topics
WOS类目	Multidisciplinary Sciences
WOS记录号	WOS:000398239200001
出版者	NATURE PUBLISHING GROUP
WOS关键词	SPIN SENSITIVITY ; SQUID ; PERFORMANCE ; FABRICATION ; TRANSITION
原始文献类型	Article
引用统计
文献类型	期刊论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/1423
专题	物质科学与技术学院_特聘教授组_王镇组
通讯作者	Chen, Lei; Wang, Zhen
作者单位	1.Chinese Acad Sci, SIMIT, CENSE, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 3.Shanghai Tech Univ, Sch Phys Sci & Technol, Shanghai 200031, Peoples R China
通讯作者单位	物质科学与技术学院
推荐引用方式 GB/T 7714	Wu, Long,Chen, Lei,Wang, Hao,et al. Meissner effect measurement of single indium particle using a customized on-chip nano-scale superconducting quantum interference device system[J]. SCIENTIFIC REPORTS,2017,7.
APA	Wu, Long,Chen, Lei,Wang, Hao,Liu, Xiaoyu,&Wang, Zhen.(2017).Meissner effect measurement of single indium particle using a customized on-chip nano-scale superconducting quantum interference device system.SCIENTIFIC REPORTS,7.
MLA	Wu, Long,et al."Meissner effect measurement of single indium particle using a customized on-chip nano-scale superconducting quantum interference device system".SCIENTIFIC REPORTS 7(2017).