Investigation of the Si/TiO&lt;inf&gt;2&lt;/inf&gt;/electrolyte interface using operando tender X-ray photoelectron spectroscopy

doi:10.1149/06606.0097ecst

	Investigation of the Si/TiO2/electrolyte interface using operando tender X-ray photoelectron spectroscopy
	Lichterman, M.F.1,2; Richter, M.H.2; Hu, S.1,2; Crumlin, E.J.3; Axnanda, S.3; Favaro, M.2,3; Drisdell, W.2,3; Hussain, Z.3; Mayer, T.4; Brunschwig, B.S.2,5; Lewis, N.S.1,2,6; Liu, Z.3,7,8 ; Lewerenz, H.-J.2
	2015
会议录名称	SYMPOSIUM ON PROCESSES AT THE SEMICONDUCTOR SOLUTION INTERFACE 6 - 227TH ECS MEETING
卷号	66
期号	6
页码	97-103
发表状态	已发表
DOI	10.1149/06606.0097ecst
摘要	Semiconductor-electrolyte interfaces allow for the creation of photoactive semiconductor systems that have band bending and other characteristics analogous to semiconductor-metal junctions (Schottky junctions). We demonstrate herein that XPS measurements can be obtained on a full three-electrode electrochemical system under potentiostatic control by use of tender X-rays to provide photoelectrons with sufficient kinetic energy to penetrate through a thin electrolyte overlayer on a portion of the working electrode. The response of the photoelectron binding energies to variations in applied voltage demonstrates that the XPS investigation works in an operando manner to elucidate the energetics of such interfaces. © The Electrochemical Society.
会议地点	Chicago, IL, United states
收录类别	EI
出版者	Electrochemical Society Inc.
EI入藏号	20152500954603
EI主题词	Binding energy ; Electrochemical electrodes ; Electrodes ; Electrolytes ; Kinetic energy ; Kinetics ; Photoelectrons ; Photons ; Semiconductor junctions
EI分类号	Electric Batteries and Fuel Cells:702 ; Electric Components:704.1 ; Electromagnetic Waves:711 ; Semiconductor Devices and Integrated Circuits:714.2 ; Chemistry:801 ; Chemical Agents and Basic Industrial Chemicals:803 ; Chemical Products Generally:804 ; Classical Physics; Quantum Theory; Relativity:931
原始文献类型	Conference article (CA)
引用统计	正在获取...
文献类型	会议论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/13424
专题	物质科学与技术学院大科学中心_PI研究组_刘志组
通讯作者	Lewerenz, H.-J.
作者单位	1.Division of Chemistry and Chemical Engineering, California Institute of Technology, Pasadena; CA, United States 2.Joint Center for Artificial Photosynthesis, California Institute of Technology, Pasadena; CA, United States 3.Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley; CA, United States 4.Surface Science Division, Materials Science Department, Darmstadt University of Technology, 64287 Darmstadt, Germany 5.Beckman Institute, California Institute of Technology, Pasadena; CA, United States 6.Kavli Nanoscience Institute, California Institute of Technology, Pasadena; CA, United States 7.State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, China 8.School of Physical Science and Technology, ShanghaiTech University, Shanghai, China
推荐引用方式 GB/T 7714	Lichterman, M.F.,Richter, M.H.,Hu, S.,et al. Investigation of the Si/TiO2/electrolyte interface using operando tender X-ray photoelectron spectroscopy[C]:Electrochemical Society Inc.,2015:97-103.