Secrecy and Robustness for Active Attack in Secure Network Coding

doi:10.1109/ISIT.2017.8006713

	Secrecy and Robustness for Active Attack in Secure Network Coding
	Hayashi, Masahito 1,2; Owari, Masaki 3; Kato, Go 4; Cai, Ning5
	2017
会议录名称	2017 IEEE INTERNATIONAL SYMPOSIUM ON INFORMATION THEORY (ISIT)
ISSN	2157-8117
页码	1172-1176
发表状态	已发表
DOI	10.1109/ISIT.2017.8006713
摘要	In the network coding, we discuss the effect by sequential error injection to information leakage. We show that there is no improvement when the network is composed of linear operations. However., when the network contains non-linear operations, we find a counterexample to improve Eve's obtained information. Further, we discuss the asymptotic rate in the linear network under the secrecy and robustness conditions.
关键词	secrecy analysis secure network coding sequential injection passive attack active attack
出版地	345 E 47TH ST, NEW YORK, NY 10017 USA
会议地点	Aachen
会议日期	25-30 June 2017
URL	查看原文
收录类别	CPCI ; EI
语种	英语
资助项目	JSPS[16K00014] ; JSPS[16KT0017]
WOS研究方向	Computer Science ; Engineering
WOS类目	Computer Science, Theory & Methods ; Engineering, Electrical & Electronic
WOS记录号	WOS:000430345201047
出版者	IEEE
EI入藏号	20174704414363
EI主题词	Codes (symbols) ; Information theory ; Linear networks ; Routers
EI分类号	Electric Networks:703.1 ; Information Theory and Signal Processing:716.1 ; Data Processing and Image Processing:723.2
WOS关键词	RESILIENT
原始文献类型	Proceedings Paper
来源库	IEEE
引用统计	正在获取...
文献类型	会议论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/13247
专题	信息科学与技术学院_特聘教授组_蔡宁组
通讯作者	Hayashi, Masahito
作者单位	1.Nagoya Univ, Grad Sch Math, Nagoya, Aichi, Japan 2.Natl Univ Singapore, Ctr Quantum Technol, Singapore, Singapore 3.Shizuoka Univ, Fac Informat, Dept Comp Sci, Shizuoka, Japan 4.NTT Corp, NTT Commun Sci Labs, Tokyo, Japan 5.ShanghaiTech Univ, Sch Informat Sci & Technol, Shanghai, Peoples R China
推荐引用方式 GB/T 7714	Hayashi, Masahito,Owari, Masaki,Kato, Go,et al. Secrecy and Robustness for Active Attack in Secure Network Coding[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2017:1172-1176.