ShanghaiTech University Knowledge Management System
Secrecy and Robustness for Active Attack in Secure Network Coding | |
2017 | |
会议录名称 | 2017 IEEE INTERNATIONAL SYMPOSIUM ON INFORMATION THEORY (ISIT)
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ISSN | 2157-8117 |
页码 | 1172-1176 |
发表状态 | 已发表 |
DOI | 10.1109/ISIT.2017.8006713 |
摘要 | In the network coding, we discuss the effect by sequential error injection to information leakage. We show that there is no improvement when the network is composed of linear operations. However., when the network contains non-linear operations, we find a counterexample to improve Eve's obtained information. Further, we discuss the asymptotic rate in the linear network under the secrecy and robustness conditions. |
关键词 | secrecy analysis secure network coding sequential injection passive attack active attack |
出版地 | 345 E 47TH ST, NEW YORK, NY 10017 USA |
会议地点 | Aachen |
会议日期 | 25-30 June 2017 |
URL | 查看原文 |
收录类别 | CPCI ; EI |
语种 | 英语 |
资助项目 | JSPS[16K00014] ; JSPS[16KT0017] |
WOS研究方向 | Computer Science ; Engineering |
WOS类目 | Computer Science, Theory & Methods ; Engineering, Electrical & Electronic |
WOS记录号 | WOS:000430345201047 |
出版者 | IEEE |
EI入藏号 | 20174704414363 |
EI主题词 | Codes (symbols) ; Information theory ; Linear networks ; Routers |
EI分类号 | Electric Networks:703.1 ; Information Theory and Signal Processing:716.1 ; Data Processing and Image Processing:723.2 |
WOS关键词 | RESILIENT |
原始文献类型 | Proceedings Paper |
来源库 | IEEE |
引用统计 | 正在获取...
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文献类型 | 会议论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/13247 |
专题 | 信息科学与技术学院_特聘教授组_蔡宁组 |
通讯作者 | Hayashi, Masahito |
作者单位 | 1.Nagoya Univ, Grad Sch Math, Nagoya, Aichi, Japan 2.Natl Univ Singapore, Ctr Quantum Technol, Singapore, Singapore 3.Shizuoka Univ, Fac Informat, Dept Comp Sci, Shizuoka, Japan 4.NTT Corp, NTT Commun Sci Labs, Tokyo, Japan 5.ShanghaiTech Univ, Sch Informat Sci & Technol, Shanghai, Peoples R China |
推荐引用方式 GB/T 7714 | Hayashi, Masahito,Owari, Masaki,Kato, Go,et al. Secrecy and Robustness for Active Attack in Secure Network Coding[C]. 345 E 47TH ST, NEW YORK, NY 10017 USA:IEEE,2017:1172-1176. |
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