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A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser
2021-11
发表期刊APPLIED SCIENCES-BASEL (IF:2.5[JCR-2023],2.7[5-Year])
ISSN2076-3417
EISSN2076-3417
卷号11期号:21
发表状态已发表
DOI10.3390/app112110272
摘要

Velocity map imaging (VMI) spectrometry is widely used to measure the momentum distribution of charged particles with the kinetic energy of a few tens of electronVolts. With the progress of femtosecond laser and X-ray free-electron laser, it becomes increasingly important to extend the electron kinetic energy to 1 keV. Here, we report on a recently built composite VMI spectrometer at the Shanghai soft X-ray free-electron laser, which can measure ion images and high-energy electron images simultaneously. In the SIMION simulation, we extended the electron kinetic energy to 1 keV with a resolution <2% while measuring the ions with the kinetic energy of 20 eV. The experimental performance is tested by measuring Ar 2p photoelectron spectra at Shanghai Synchrotron Radiation Facility, and O+ kinetic energy spectrum from dissociative ionization of O2 by 800 nm femtosecond laser. We reached a resolution of 1.5% at the electron kinetic energy of 500 eV. When the electron arm is set for 100 eV, a resolution of 4% is reached at the ion kinetic energy of 5.6 eV. This composite VMI spectrometer will support the experiment, such as X-ray multi-photon excitation/ionization, Auger electrons emission, attosecond streaking

关键词shanghaiTech
URL查看原文
收录类别SCIE ; SCI
语种英语
资助项目National Natural Science Foundation of China[11574020,12174259,11604003]
WOS研究方向Chemistry ; Engineering ; Materials Science ; Physics
WOS类目Chemistry, Multidisciplinary ; Engineering, Multidisciplinary ; Materials Science, Multidisciplinary ; Physics, Applied
WOS记录号WOS:000779558800001
出版者MDPI
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文献类型期刊论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/131984
专题大科学中心
大科学中心_PI研究组_刘志组
大科学中心_PI研究组_刘小井组
物质科学与技术学院_硕士生
物质科学与技术学院_博士生
大科学中心_公共科研平台_大科学装置建设部
通讯作者Xu, Weiqing; Liu, Xiaojing
作者单位
1.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China
2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
3.ShanghaiTech Univ, Ctr Transformat Sci, Shanghai 201210, Peoples R China
第一作者单位物质科学与技术学院;  上海科技大学
通讯作者单位上海科技大学;  物质科学与技术学院
第一作者的第一单位物质科学与技术学院
推荐引用方式
GB/T 7714
Ding, Bocheng,Xu, Weiqing,Wu, Ruichang,et al. A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser[J]. APPLIED SCIENCES-BASEL,2021,11(21).
APA Ding, Bocheng.,Xu, Weiqing.,Wu, Ruichang.,Feng, Yunfei.,Tian, Lifang.,...&Liu, Xiaojing.(2021).A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser.APPLIED SCIENCES-BASEL,11(21).
MLA Ding, Bocheng,et al."A Composite Velocity Map Imaging Spectrometer for Ions and 1 keV Electrons at the Shanghai Soft X-ray Free-Electron Laser".APPLIED SCIENCES-BASEL 11.21(2021).
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