A soft X-ray emission flat-field grating spectrometer for time-resolved spectroscopy

doi:10.1117/12.2584349

	A soft X-ray emission flat-field grating spectrometer for time-resolved spectroscopy
	Yang, Xiaowei; Meng, Jianwei; Liu, Peng; Liu, Xing; Weng, Tsu-Chien
	2020
会议录名称	INTERNATIONAL CONFERENCE ON OPTOELECTRONIC AND MICROELECTRONIC TECHNOLOGY AND APPLICATION
ISSN	0277-786X
卷号	11617
发表状态	已发表
DOI	10.1117/12.2584349
摘要	A time-resolved soft X-ray emission spectrometer covering 250-620 eV is presented for the study of chemical reaction processes. Contrary to conventional time-resolved spectrometer, our spectrometer can obtain a two-dimensional time-energy map in single shot by adding an imaging mirror to the flat-field spectrometer. The temporal changes are spatially encoded in the footprint of the probe X-ray beam on the sample via grazing incidence geometry. The flat-field spectrometer design is chosen to alleviate the aberration of the imaging mirror. The spectrometer is optimized at 400 eV, targeting at over 2000 resolving power and sub-picosecond time resolution.
会议录编者/会议主办者	Chinese Soc Opt Engn, Nanjing Univ Sci & Technol, Nanjing Univ, Fujian Normal Univ, Nanjing Univ Posts & Telecommunicat, Jiangsu Key Lab Spectral Imaging & Intelligent Sense, Hangzhou Dianzi Univ, Sch Elect Informat, Jiangsu Opt Soc
关键词	X-ray emission spectrometer time-resolved X-ray free electron laser
会议名称	International Conference on Optoelectronic and Microelectronic Technology and Application
会议地点	Nanjing, PEOPLES R CHINA
会议日期	OCT 20-22, 2020
收录类别	EI ; CPCI ; CPCI-S
语种	英语
WOS研究方向	Engineering ; Science & Technology - Other Topics ; Optics
WOS类目	Engineering, Electrical & Electronic ; Nanoscience & Nanotechnology ; Optics
WOS记录号	WOS:000665756500006
出版者	SPIE-INT SOC OPTICAL ENGINEERING
原始文献类型	Proceedings Paper
引用统计	正在获取...
文献类型	会议论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/127790
专题	物质科学与技术学院硬x射线自由电子激光装置项目物质科学与技术学院_PI研究组_叶柏华组大科学中心_PI研究组_翁祖谦组大科学中心大科学中心_公共科研平台_大科学装置建设部
通讯作者	Weng, Tsu-Chien
作者单位	ShanghaiTech Univ, Sch Phys Sci & Technol, 393 Middle Huaxia Rd, Shanghai, Peoples R China
第一作者单位	物质科学与技术学院
通讯作者单位	物质科学与技术学院
第一作者的第一单位	物质科学与技术学院
推荐引用方式 GB/T 7714	Yang, Xiaowei,Meng, Jianwei,Liu, Peng,et al. A soft X-ray emission flat-field grating spectrometer for time-resolved spectroscopy[C]//Chinese Soc Opt Engn, Nanjing Univ Sci & Technol, Nanjing Univ, Fujian Normal Univ, Nanjing Univ Posts & Telecommunicat, Jiangsu Key Lab Spectral Imaging & Intelligent Sense, Hangzhou Dianzi Univ, Sch Elect Informat, Jiangsu Opt Soc:SPIE-INT SOC OPTICAL ENGINEERING,2020.