Improved Hierarchical IR Drop Analysis in Homogeneous Circuits

doi:10.1109/ICSICT49897.2020.9278267

	Improved Hierarchical IR Drop Analysis in Homogeneous Circuits
	Chengrui Zhang; Pingqiang Zhou
	2020-11
会议录名称	2020 IEEE 15TH INTERNATIONAL CONFERENCE ON SOLID-STATE & INTEGRATED CIRCUIT TECHNOLOGY (ICSICT)
发表状态	已发表
DOI	10.1109/ICSICT49897.2020.9278267
摘要	IR drop analysis plays an important role in chip design. However, this analysis usually takes long time. In this work, we propose an improved hierarchical method for IR drop analysis in homogeneous chips. Experimental results show that the more speedup can be achieved with larger number of homogeneous cores. For the chip with 8 homogeneous but not identical cores, our approach can obtain 5.21X speedup in the whole analysis with 99% accuracy.
关键词	IR drop analysis homogeneous circuit hierarchical analysis GMRES
会议名称	International Conference on Solid-State & Integrated Circuit Technology (ICSICT)
会议地点	Kunming, China
会议日期	3-6 Nov. 2020
URL	查看原文
收录类别	EI
语种	英语
EI入藏号	978-1-7281-6235-5
来源库	IEEE
文献类型	会议论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/126733
专题	信息科学与技术学院信息科学与技术学院_PI研究组_周平强组信息科学与技术学院_硕士生
作者单位	School of Information Science and Technology, ShanghaiTech University, Shanghai, P. R. China
第一作者单位	信息科学与技术学院
第一作者的第一单位	信息科学与技术学院
推荐引用方式 GB/T 7714	Chengrui Zhang,Pingqiang Zhou. Improved Hierarchical IR Drop Analysis in Homogeneous Circuits[C],2020.