Measurement of electronic structure and surface reconstruction in the superionic Cu2-xTe
Liu, S.1,2,3; Xia, W.1,6; Huang, K.1; Pei, D.4; Deng, T.3,5; Liang, A. J.1,6; Jiang, J.7; Yang, H. F.1; Zhang, J.1; Zheng, H. J.1
2021
发表期刊PHYSICAL REVIEW B
ISSN2469-9950
EISSN2469-9969
卷号103期号:11
DOI10.1103/PhysRevB.103.115127
摘要Recently, layered copper chalcogenides Cu2X family (X = S, Se, Te) has attracted tremendous research interests due to their high thermoelectric performance, which is partly due to the superionic behavior of mobile Cu ions, making these compounds phonon liquids. Here, we systematically investigate the electronic structure and its temperature evolution of the less studied single crystal Cu2-xTe by the combination of angle resolved photoemission spectroscopy (ARPES) and scanning tunneling microscope/spectroscopy (STM/STS) experiments. While the band structure of the Cu2-xTe shows agreement with the calculations, we clearly observe a 2 x 2 surface reconstruction from both our low temperature ARPES and STM/STS experiments which survives up to room temperature. Interestingly, our low temperature STM experiments further reveal multiple types of reconstruction patterns, which suggests the origin of the surface reconstruction being the distributed deficiency of liquidlike Cu ions. Our findings reveal the electronic structure and impurity level of Cu-2 Te, which provides knowledge about its thermoelectric properties from the electronic degree of freedom.
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收录类别SCIE ; EI
语种英语
WOS研究方向Materials Science ; Physics
WOS类目Materials Science, Multidisciplinary ; Physics, Applied ; Physics, Condensed Matter
WOS记录号WOS:000646315100007
出版者AMER PHYSICAL SOC
原始文献类型Article
引用统计
文献类型期刊论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/126718
专题物质科学与技术学院_博士生
物质科学与技术学院_PI研究组_柳仲楷组
物质科学与技术学院_PI研究组_郭艳峰组
物质科学与技术学院_特聘教授组_陈宇林
物质科学与技术学院_公共科研平台_拓扑物理实验室
大科学中心_公共科研平台_大科学装置建设部
通讯作者Wang, M. X.
作者单位1.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China;
2.Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China;
3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China;
4.Univ Oxford, Dept Phys, Oxford OX1 3PU, England;
5.Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Shanghai 200050, Peoples R China;
6.ShanghaiTech Univ, ShanghaiTech Lab Topol Phys, Shanghai 201210, Peoples R China;
7.Lawrence Berkeley Natl Lab, Adv Light Source, Berkeley, CA 94720 USA;
8.Tsinghua Univ, Dept Phys, State Key Lab Low Dimens Quantum Phys, Beijing 100084, Peoples R China;
9.Frontier Sci Ctr Quantum Informat, Beijing 100084, Peoples R China
第一作者单位物质科学与技术学院
通讯作者单位物质科学与技术学院;  上海科技大学
第一作者的第一单位物质科学与技术学院
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Liu, S.,Xia, W.,Huang, K.,et al. Measurement of electronic structure and surface reconstruction in the superionic Cu2-xTe[J]. PHYSICAL REVIEW B,2021,103(11).
APA Liu, S..,Xia, W..,Huang, K..,Pei, D..,Deng, T..,...&Chen, Y. L..(2021).Measurement of electronic structure and surface reconstruction in the superionic Cu2-xTe.PHYSICAL REVIEW B,103(11).
MLA Liu, S.,et al."Measurement of electronic structure and surface reconstruction in the superionic Cu2-xTe".PHYSICAL REVIEW B 103.11(2021).
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