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Measurement of electronic structure and surface reconstruction in the superionic Cu2-xTe | |
Liu, S.1,2,3; Xia, W.1,6; Huang, K.1; Pei, D.4; Deng, T.3,5; Liang, A. J.1,6; Jiang, J.7; Yang, H. F.1; Zhang, J.1; Zheng, H. J.1 | |
2021 | |
发表期刊 | PHYSICAL REVIEW B |
ISSN | 2469-9950 |
EISSN | 2469-9969 |
卷号 | 103期号:11 |
DOI | 10.1103/PhysRevB.103.115127 |
摘要 | Recently, layered copper chalcogenides Cu2X family (X = S, Se, Te) has attracted tremendous research interests due to their high thermoelectric performance, which is partly due to the superionic behavior of mobile Cu ions, making these compounds phonon liquids. Here, we systematically investigate the electronic structure and its temperature evolution of the less studied single crystal Cu2-xTe by the combination of angle resolved photoemission spectroscopy (ARPES) and scanning tunneling microscope/spectroscopy (STM/STS) experiments. While the band structure of the Cu2-xTe shows agreement with the calculations, we clearly observe a 2 x 2 surface reconstruction from both our low temperature ARPES and STM/STS experiments which survives up to room temperature. Interestingly, our low temperature STM experiments further reveal multiple types of reconstruction patterns, which suggests the origin of the surface reconstruction being the distributed deficiency of liquidlike Cu ions. Our findings reveal the electronic structure and impurity level of Cu-2 Te, which provides knowledge about its thermoelectric properties from the electronic degree of freedom. |
URL | 查看原文 |
收录类别 | SCIE ; EI |
语种 | 英语 |
WOS研究方向 | Materials Science ; Physics |
WOS类目 | Materials Science, Multidisciplinary ; Physics, Applied ; Physics, Condensed Matter |
WOS记录号 | WOS:000646315100007 |
出版者 | AMER PHYSICAL SOC |
原始文献类型 | Article |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/126718 |
专题 | 物质科学与技术学院_博士生 物质科学与技术学院_PI研究组_柳仲楷组 物质科学与技术学院_PI研究组_郭艳峰组 物质科学与技术学院_特聘教授组_陈宇林 物质科学与技术学院_公共科研平台_拓扑物理实验室 大科学中心_公共科研平台_大科学装置建设部 |
通讯作者 | Wang, M. X. |
作者单位 | 1.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China; 2.Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China; 3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China; 4.Univ Oxford, Dept Phys, Oxford OX1 3PU, England; 5.Chinese Acad Sci, Shanghai Inst Microsyst & Informat Technol, Shanghai 200050, Peoples R China; 6.ShanghaiTech Univ, ShanghaiTech Lab Topol Phys, Shanghai 201210, Peoples R China; 7.Lawrence Berkeley Natl Lab, Adv Light Source, Berkeley, CA 94720 USA; 8.Tsinghua Univ, Dept Phys, State Key Lab Low Dimens Quantum Phys, Beijing 100084, Peoples R China; 9.Frontier Sci Ctr Quantum Informat, Beijing 100084, Peoples R China |
第一作者单位 | 物质科学与技术学院 |
通讯作者单位 | 物质科学与技术学院; 上海科技大学 |
第一作者的第一单位 | 物质科学与技术学院 |
推荐引用方式 GB/T 7714 | Liu, S.,Xia, W.,Huang, K.,et al. Measurement of electronic structure and surface reconstruction in the superionic Cu2-xTe[J]. PHYSICAL REVIEW B,2021,103(11). |
APA | Liu, S..,Xia, W..,Huang, K..,Pei, D..,Deng, T..,...&Chen, Y. L..(2021).Measurement of electronic structure and surface reconstruction in the superionic Cu2-xTe.PHYSICAL REVIEW B,103(11). |
MLA | Liu, S.,et al."Measurement of electronic structure and surface reconstruction in the superionic Cu2-xTe".PHYSICAL REVIEW B 103.11(2021). |
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