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Eddy Current Testing of Metal Cracks Using Spin Hall Magnetoresistance Sensor and Machine Learning | |
2020 | |
发表期刊 | IEEE SENSORS JOURNAL (IF:4.3[JCR-2023],4.2[5-Year]) |
ISSN | 2379-9153 |
卷号 | 20期号:18页码:10502-10510 |
发表状态 | 已发表 |
DOI | 10.1109/JSEN.2020.2993584 |
摘要 | Recently we have developed a spin Hall magnetoresistance (SMR) sensor which operates under AC bias and sense currents. Here we demonstrate both theoretically and experimentally that the SMR sensor is uniquely suited for eddy current testing applications because both the coil and sensor utilize AC current as the excitation source. The use of SMR sensor effectively eliminates the necessity of any demodulation or lock-in technique for detecting the eddy current, which greatly simplifies the detection system. Furthermore, we show that the combination of principal component analysis and decision tree model is effective in classifying the metal cracks. The relatively clean signals obtained by the SMR sensor greatly facilitates the subsequent signal analysis and ensures high accuracy in the classification of different types of crack features. |
URL | 查看原文 |
收录类别 | SCI ; SCIE ; EI |
来源库 | IEEE |
引用统计 | 正在获取...
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文献类型 | 期刊论文 |
条目标识符 | https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/123558 |
专题 | 信息科学与技术学院 信息科学与技术学院_PI研究组_杨雨梦组 |
作者单位 | 1.Department of Electrical and Computer Engineering, National University of Singapore, Singapore 2.United Microelectronics Corporation, Singapore 3.School of Information Science and Technology, ShanghaiTech University, Shanghai, China |
推荐引用方式 GB/T 7714 | Yanjun Xu,Yumeng Yang,Yihong Wu. Eddy Current Testing of Metal Cracks Using Spin Hall Magnetoresistance Sensor and Machine Learning[J]. IEEE SENSORS JOURNAL,2020,20(18):10502-10510. |
APA | Yanjun Xu,Yumeng Yang,&Yihong Wu.(2020).Eddy Current Testing of Metal Cracks Using Spin Hall Magnetoresistance Sensor and Machine Learning.IEEE SENSORS JOURNAL,20(18),10502-10510. |
MLA | Yanjun Xu,et al."Eddy Current Testing of Metal Cracks Using Spin Hall Magnetoresistance Sensor and Machine Learning".IEEE SENSORS JOURNAL 20.18(2020):10502-10510. |
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