Depth-Resolved Magnetization Dynamics Revealed by X-Ray Reflectometry Ferromagnetic Resonance

doi:10.1103/PhysRevLett.125.137201

	Depth-Resolved Magnetization Dynamics Revealed by X-Ray Reflectometry Ferromagnetic Resonance
	Burn, D. M.1; Zhang, S. L.2,3 ; Yu, G. Q.4; Guang, Y.4; Chen, H. J.5,6; Qiu, X. P.5,6; van der Laan, G.1; Hesjedal, T.7
	2020-09-24
发表期刊	PHYSICAL REVIEW LETTERS (IF:8.1[JCR-2023],8.3[5-Year])
ISSN	0031-9007
卷号	125 期号:13
DOI	10.1103/PhysRevLett.125.137201
摘要	Magnetic multilayers offer diverse opportunities for the development of ultrafast functional devices through advanced interface and layer engineering. Nevertheless, a method for determining their dynamic properties as a function of depth throughout such stacks has remained elusive. By probing the ferromagnetic resonance modes with element-selective soft x-ray resonant reflectivity, we gain access to the magnetization dynamics as a function of depth. Most notably, using reflectometry ferromagnetic resonance, we find a phase lag between the coupled ferromagnetic layers in [CoFeB/MgO/Ta](4) multilayers that is invisible to other techniques. The use of reflectometry ferromagnetic resonance enables the time-resolved and depth-resolved probing of the complex magnetization dynamics of a wide range of functional magnetic heterostructures with absorption edges in the soft x-ray wavelength regime.
收录类别	SCI ; SCIE ; EI
语种	英语
资助项目	Engineering and Physical Sciences Research Council (UK)[EP/N032128/1] ; National Natural Science Foundation of China[11874409] ; Beijing Natural Science Foundation[Z190009] ; Analytical Instrumentation Center, School of Physical Sciences and Technology, ShanghaiTech University[SPSTAIC10112914]
WOS研究方向	Physics
WOS类目	Physics, Multidisciplinary
WOS记录号	WOS:000572282800006
出版者	AMER PHYSICAL SOC
引用统计	正在获取...
文献类型	期刊论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/123537
专题	物质科学与技术学院_PI研究组_张石磊组
通讯作者	Burn, D. M.; Zhang, S. L.; van der Laan, G.
作者单位	1.Diamond Light Source, Harwell Sci & Innovat Campus, Didcot OX11 0DE, Oxon, England; 2.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 200031, Peoples R China; 3.ShanghaiTech Univ, ShanghaiTech Lab Topol Phys, Shanghai 200031, Peoples R China; 4.Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R China; 5.Tongji Univ, Shanghai Key Lab Special Artificial Microstruct M, Shanghai 200092, Peoples R China; 6.Tongji Univ, Sch Phys Sci & Engn, Shanghai 200092, Peoples R China; 7.Univ Oxford, Clarendon Lab, Dept Phys, Oxford OX1 3PU, England
通讯作者单位	物质科学与技术学院; 上海科技大学
推荐引用方式 GB/T 7714	Burn, D. M.,Zhang, S. L.,Yu, G. Q.,et al. Depth-Resolved Magnetization Dynamics Revealed by X-Ray Reflectometry Ferromagnetic Resonance[J]. PHYSICAL REVIEW LETTERS,2020,125(13).
APA	Burn, D. M..,Zhang, S. L..,Yu, G. Q..,Guang, Y..,Chen, H. J..,...&Hesjedal, T..(2020).Depth-Resolved Magnetization Dynamics Revealed by X-Ray Reflectometry Ferromagnetic Resonance.PHYSICAL REVIEW LETTERS,125(13).
MLA	Burn, D. M.,et al."Depth-Resolved Magnetization Dynamics Revealed by X-Ray Reflectometry Ferromagnetic Resonance".PHYSICAL REVIEW LETTERS 125.13(2020).