High-order PT symmetry-based optical sensor

doi:10.1117/12.2546440

	High-order PT symmetry-based optical sensor
	Wu, Yulin1,3,4 ; Zhou, Peiji1 ; Li, Ting1,3,4 ; Wan, Weishi2 ; Zou, Yi1
	2020
会议录名称	INTEGRATED OPTICS: DEVICES, MATERIALS, AND TECHNOLOGIES XXIV 2020
ISSN	1996756X
卷号	11283
发表状态	已发表
DOI	10.1117/12.2546440
摘要	We investigate a fourth-order PT symmetric optical sensor and analyze its eigenfrequency phase diagram. The four eigenfrequencies of our optical sensor simultaneously collapse at the high-order exceptional point in parameter space, providing a quarter root relation between the frequency splitting amount and the perturbation. A clear sensitivity boost is observed when comparing the frequency splitting with other optical sensors under small perturbation condition. © COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.
会议地点	San Francisco, CA, United states
收录类别	EI ; CPCI ; CPCI-S
资助项目	National Natural Science Foundation of China[61705099] ; National Natural Science Foundation of China[]
出版者	SPIE
EI入藏号	20201708501420
EI主题词	Integrated optics
EI分类号	Optical Devices and Systems:741.3
原始文献类型	Conference article (CA)
引用统计	正在获取...
文献类型	会议论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/121515
专题	信息科学与技术学院_硕士生物质科学与技术学院大科学中心_PI研究组_万唯实组信息科学与技术学院_PI研究组_邹毅组信息科学与技术学院_博士生大科学中心
通讯作者	Zou, Yi
作者单位	1.School of Information Science and Technology, ShanghaiTech University, Shanghai; 201210, China 2.School of Physical Science and Technology, ShanghaiTech University, Shanghai; 201210, China 3.Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai; 200050, China 4.University of Chinese Academy of Sciences, Beijing; 100049, China
第一作者单位	信息科学与技术学院
通讯作者单位	信息科学与技术学院
第一作者的第一单位	信息科学与技术学院
推荐引用方式 GB/T 7714	Wu, Yulin,Zhou, Peiji,Li, Ting,et al. High-order PT symmetry-based optical sensor[C]:SPIE,2020.