Phase evolution with the film thickness in PLD-grown titanium oxides films
2020-08-05
发表期刊JOURNAL OF ALLOYS AND COMPOUNDS (IF:5.8[JCR-2023],5.3[5-Year])
ISSN0925-8388
卷号831
发表状态已发表
DOI10.1016/j.jallcom.2020.154727
摘要

Titanium oxides exhibit an intriguing structure-property correlation, due to the variable valence character of titanium ion. Here we report the growth and characterization of the superconducting binary Ti–O films. The films were grown by the pulsed laser deposition (PLD) technique on the α-Al2O3 substrates, through ablating Ti2O3. It is found that, with the increase of the film thickness, the film reveals a phase evolution from the cubic TiO phase to the orthogonal Ti2O3 phase. Meanwhile, the magnitude of resistivity and the superconducting transition temperature Tc of these films also show the systematic variation with the increase of the film thickness.
© 2020 Elsevier B.V.

收录类别SCI ; SCIE ; EI
资助项目Youth Innovation Promotion Association of the Chinese Academy of Sciences[2015187] ; Natural Science Foundation of Shanghai[17ZR1436300] ; National Natural Science Foundation of China[11204338]
出版者Elsevier Ltd
EI入藏号20201208320996
EI主题词Alumina ; Aluminum oxide ; Film thickness ; Pulsed laser deposition ; Superconducting films ; Superconducting transition temperature ; Titanium oxides
EI分类号Superconducting Materials:708.3 ; Laser Applications:744.9 ; Inorganic Compounds:804.2
原始文献类型Journal article (JA)
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文献类型期刊论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/120829
专题物质科学与技术学院_博士生
通讯作者Li, Zhuojun; Mu, Gang
作者单位
1.State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai; 200050, China
2.CAS Center for Excellence in Superconducting Electronics (CENSE), Shanghai; 200050, China
3.University of Chinese Academy of Sciences, Beijing; 100049, China
4.School of Physical Science and Technology, ShanghaiTech University, Shanghai; 201210, China
5.Department of Physics and State Key Laboratory of Surface Physics, Fudan University, Shanghai; 200433, China
推荐引用方式
GB/T 7714
Feng, Jiaxin,Wang, Lingling,Song, Yekai,et al. Phase evolution with the film thickness in PLD-grown titanium oxides films[J]. JOURNAL OF ALLOYS AND COMPOUNDS,2020,831.
APA Feng, Jiaxin.,Wang, Lingling.,Song, Yekai.,Yu, Aobo.,Li, Wei.,...&Mu, Gang.(2020).Phase evolution with the film thickness in PLD-grown titanium oxides films.JOURNAL OF ALLOYS AND COMPOUNDS,831.
MLA Feng, Jiaxin,et al."Phase evolution with the film thickness in PLD-grown titanium oxides films".JOURNAL OF ALLOYS AND COMPOUNDS 831(2020).
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