Synchrotron Radiation Infrared Three-Dimensional Microspectroscopy Based on Point Scanning Method

doi:10.3788/AOS202040.0334001

	Synchrotron Radiation Infrared Three-Dimensional Microspectroscopy Based on Point Scanning Method
	Lin, Yuecheng 1,4; Tong, Yajun2 ; Ji, Te 1,3; Peng, Weiwei 1,3; Xiao, Tiqiao 1,3; Zhu, Huachun 1,3; Chen, Min 1,3
	2020-02-10
发表期刊	光学学报 (IF:1.6[JCR-2023],1.1[5-Year])
ISSN	0253-2239
卷号	40 期号:3
发表状态	已发表
DOI	10.3788/AOS202040.0334001
摘要	Synchrotron radiation infrared (SRIR) light has the advantages of wide spectral range, small divergence angle, high brightness, and high signal-to-noise ratio. Combined with traditional infrared spectroscopy technology, SRIR microspectroscopy technology is used in infrared spectroscopy microscopy for samples, and the micron-level spatial spectral information of samples can be obtained. By taking an MiTeGen polyimide loop as the sample and using SRIR light from line station BL01B1 of Shanghai synchrotron radiation facility as the light source, we perform the synchrotron radiation infrared three-dimensional (3D) microspectroscopy experiments based on point scanning method. The two-dimensional microspectral information of the MiTeGen polyimide loop under different angles is collected based on point scanning method. The microspectral information in the wavenumber range of 14951485 cm-1 is selected, SRIR 3D microscopic reconstruction is performed by using algebraic iteration algorithm for the amide Ⅱ chemical component of the polyimide ring, and a whole 3D reconstruction image is obtained. The research shows that this method can reconstruct the 3D infrared microscopic structure of the sample's chemical components with a high signal-to-noise ratio. © 2020, Chinese Lasers Press. All right reserved.
收录类别	EI ; ESCI ; 北大核心
出版者	Chinese Optical Society
EI入藏号	20201408371204
EI主题词	Amides ; Image reconstruction ; Infrared spectroscopy ; Iterative methods ; Light ; Light sources ; Optical data processing ; Polyimides ; Scanning ; Signal to noise ratio ; Spectroscopic analysis ; Synchrotron radiation ; Tomography ; X ray optics
EI分类号	Information Theory and Signal Processing:716.1 ; Data Processing and Image Processing:723.2 ; Light/Optics:741.1 ; Imaging Techniques:746 ; Chemistry:801 ; Organic Compounds:804.1 ; Organic Polymers:815.1.1 ; Numerical Methods:921.6 ; Particle Accelerators:932.1.1
原始文献类型	Journal article (JA)
引用统计	正在获取...
文献类型	期刊论文
条目标识符	https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/120824
专题	硬x射线自由电子激光装置项目大科学中心_公共科研平台_大科学装置建设部
通讯作者	Zhu, Huachun
作者单位	1.Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai; 201800, China 2.Shanghai Tech University, Shanghai; 201210, China 3.Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai; 201204, China 4.University of Chinese Academy of Sciences, Beijing; 100049, China
推荐引用方式 GB/T 7714	Lin, Yuecheng,Tong, Yajun,Ji, Te,et al. Synchrotron Radiation Infrared Three-Dimensional Microspectroscopy Based on Point Scanning Method[J]. 光学学报,2020,40(3).
APA	Lin, Yuecheng.,Tong, Yajun.,Ji, Te.,Peng, Weiwei.,Xiao, Tiqiao.,...&Chen, Min.(2020).Synchrotron Radiation Infrared Three-Dimensional Microspectroscopy Based on Point Scanning Method.光学学报,40(3).
MLA	Lin, Yuecheng,et al."Synchrotron Radiation Infrared Three-Dimensional Microspectroscopy Based on Point Scanning Method".光学学报 40.3(2020).