Soft X-ray spectroscopy with transition-edge sensors at Stanford Synchrotron Radiation Lightsource beamline 10-1
2019
发表期刊REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN10897623
卷号90期号:11
发表状态已发表
DOI10.1063/1.5119155
摘要

We present results obtained with a new soft X-ray spectrometer based on transition-edge sensors (TESs) composed of Mo/Cu bilayers coupled to bismuth absorbers. This spectrometer simultaneously provides excellent energy resolution, high detection efficiency, and broadband spectral coverage. The new spectrometer is optimized for incident X-ray energies below 2 keV. Each pixel serves as both a highly sensitive calorimeter and an X-ray absorber with near unity quantum efficiency. We have commissioned this 240-pixel TES spectrometer at the Stanford Synchrotron Radiation Lightsource beamline 10-1 (BL 10-1) and used it to probe the local electronic structure of sample materials with unprecedented sensitivity in the soft X-ray regime. As mounted, the TES spectrometer has a maximum detection solid angle of 2 × 10-3 sr. The energy resolution of all pixels combined is 1.5 eV full width at half maximum at 500 eV. We describe the performance of the TES spectrometer in terms of its energy resolution and count-rate capability and demonstrate its utility as a high throughput detector for synchrotron-based X-ray spectroscopy. Results from initial X-ray emission spectroscopy and resonant inelastic X-ray scattering experiments obtained with the spectrometer are presented.
© 2019 Author(s).

收录类别SCI ; SCIE ; EI
资助项目U.S. Department of Energy ; Laboratory Directed Research and Development ; Savannah River Operations Office, U.S. Department of Energy[100487] ; Human Frontier Science Program ; Office of Science
WOS记录号WOS:000504097900002
出版者American Institute of Physics Inc.
EI入藏号20194607667878
EI主题词Electronic structure ; Emission spectroscopy ; Nanosensors ; Pixels ; Synchrotron radiation ; Synchrotrons ; X ray scattering ; X ray spectrometers ; X ray spectroscopy ; X rays
EI分类号Optical Devices and Systems:741.3 ; Nanotechnology:761 ; High Energy Physics:932.1 ; Particle Accelerators:932.1.1 ; Solid State Physics:933
原始文献类型Journal article (JA)
引用统计
文献类型期刊论文
条目标识符https://kms.shanghaitech.edu.cn/handle/2MSLDSTB/104315
专题物质科学与技术学院
大科学中心_PI研究组_翁祖谦组
通讯作者Lee, Sang-Jun
作者单位
1.SLAC National Accelerator Laboratory, Menlo Park; CA; 94025, United States
2.Stanford University, Stanford; CA; 94305, United States
3.National Institute of Standards and Technology, Boulder; CO; 80305, United States
4.Santa Clara University, Santa Clara; CA; 95053, United States
5.School of Chemistry, University of Manchester, Manchester; M13 9PL, United Kingdom
6.University of Manchester at Harwell, Didcot; OX11 0FA, United Kingdom
7.PAL-XFEL, Pohang Accelerator Laboratory, Gyeongbuk; 37673, Korea, Republic of
8.School of Physical Science and Technology, ShanghaiTech University, 393 Middle Huaxia Road, Pudong, Shanghai; 201210, China
推荐引用方式
GB/T 7714
Lee, Sang-Jun,Titus, Charles J.,Alonso Mori, Roberto,et al. Soft X-ray spectroscopy with transition-edge sensors at Stanford Synchrotron Radiation Lightsource beamline 10-1[J]. REVIEW OF SCIENTIFIC INSTRUMENTS,2019,90(11).
APA Lee, Sang-Jun.,Titus, Charles J..,Alonso Mori, Roberto.,Baker, Michael L..,Bennett, Douglas A..,...&Nordlund, Dennis.(2019).Soft X-ray spectroscopy with transition-edge sensors at Stanford Synchrotron Radiation Lightsource beamline 10-1.REVIEW OF SCIENTIFIC INSTRUMENTS,90(11).
MLA Lee, Sang-Jun,et al."Soft X-ray spectroscopy with transition-edge sensors at Stanford Synchrotron Radiation Lightsource beamline 10-1".REVIEW OF SCIENTIFIC INSTRUMENTS 90.11(2019).
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